Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045843
H. Kato, Takehiko Kobayashi
Ultra wideband (UWB) automotive radars, less expensive than conventional millimeter-wave radars, have attracted attention from the viewpoint of reducing traffic accidents. The performance of automotive radars is degraded by interference from nearby radars operating at the same frequency. We assumed a scenario where two cars pass each other on a road. The desired-to-undesired signal power ratio (DUR) was found to vary approximately from -10 to 30 dB when employing cross polarization. Allocation of different maximum length sequences to different radars facilitates suppression of interference from other radars. Probabilities of false alarm (Pfa) and detection of the passing car (Pd) were evaluated by simulation. It was found that Pd = 0.995 and 0.993 for Pfa = 10-2 and 10-4, respectively, when DUR = -10 dB (the worst prediction).
{"title":"Detection probability of automotive radars using maximum length sequences to suppress interference from nearby radars","authors":"H. Kato, Takehiko Kobayashi","doi":"10.1109/NAECON.2014.7045843","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045843","url":null,"abstract":"Ultra wideband (UWB) automotive radars, less expensive than conventional millimeter-wave radars, have attracted attention from the viewpoint of reducing traffic accidents. The performance of automotive radars is degraded by interference from nearby radars operating at the same frequency. We assumed a scenario where two cars pass each other on a road. The desired-to-undesired signal power ratio (DUR) was found to vary approximately from -10 to 30 dB when employing cross polarization. Allocation of different maximum length sequences to different radars facilitates suppression of interference from other radars. Probabilities of false alarm (Pfa) and detection of the passing car (Pd) were evaluated by simulation. It was found that Pd = 0.995 and 0.993 for Pfa = 10-2 and 10-4, respectively, when DUR = -10 dB (the worst prediction).","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"284 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115423070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045835
Christopher I. Allen, J. Petrosky, P. L. Orlando
This research predicts the effects of the natural radiation environment in low earth orbit on a 6T SRAM cell designed using the CMOS portion of a 130 nm BiCMOS technology. It is determined that this technology is quite sensitive to single event upset (SEU): at 200 km altitude and without shielding, the predicted SEU rate is 6.7×10-3 bit-1yr-1; at 2000 km altitude, the rate increases to 1.9×101 bit-1yr-1. Nonetheless, these results compare favorably to previously published SEU data [1], [2] regarding the bipolar portion of similar BiCMOS technology.
{"title":"Effects of non-ionizing radiation on a 130 nm CMOS SRAM for low earth orbit applications","authors":"Christopher I. Allen, J. Petrosky, P. L. Orlando","doi":"10.1109/NAECON.2014.7045835","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045835","url":null,"abstract":"This research predicts the effects of the natural radiation environment in low earth orbit on a 6T SRAM cell designed using the CMOS portion of a 130 nm BiCMOS technology. It is determined that this technology is quite sensitive to single event upset (SEU): at 200 km altitude and without shielding, the predicted SEU rate is 6.7×10<sup>-3</sup> bit<sup>-1</sup>yr<sup>-1</sup>; at 2000 km altitude, the rate increases to 1.9×10<sup>1</sup> bit<sup>-1</sup>yr<sup>-1</sup>. Nonetheless, these results compare favorably to previously published SEU data [1], [2] regarding the bipolar portion of similar BiCMOS technology.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126146733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045777
Yangcheng Li, A. Maslov, N. Limberopoulos, V. Astratov
We experimentally studied whispering-gallery-modes (WGMs) and demonstrated resonance enhancement of optical forces evanescently exerted on dielectric microspheres. We showed that the resonant light pressure can be used for optical sorting of microparticles with extraordinary uniform resonant properties that is unachievable by conventional sorting techniques.
{"title":"Demonstration of whispering-gallery-mode resonant enhancement of optical forces","authors":"Yangcheng Li, A. Maslov, N. Limberopoulos, V. Astratov","doi":"10.1109/NAECON.2014.7045777","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045777","url":null,"abstract":"We experimentally studied whispering-gallery-modes (WGMs) and demonstrated resonance enhancement of optical forces evanescently exerted on dielectric microspheres. We showed that the resonant light pressure can be used for optical sorting of microparticles with extraordinary uniform resonant properties that is unachievable by conventional sorting techniques.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"132 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122581124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045781
Guiru Gu, Lin Li, Xuejun Lu
Surface plasmonic resonance has been proved to be an effective way for enhancing infrared photodetector performance. In this paper, we report the optimization of the plasmonic structures by numerical simulation and experimental verification. The mechanism of the high enhancement is also analyzed and discussed for different plasmonic structures.
{"title":"Optimizing surface plasmonic structures for high infrared photodetector enhancement","authors":"Guiru Gu, Lin Li, Xuejun Lu","doi":"10.1109/NAECON.2014.7045781","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045781","url":null,"abstract":"Surface plasmonic resonance has been proved to be an effective way for enhancing infrared photodetector performance. In this paper, we report the optimization of the plasmonic structures by numerical simulation and experimental verification. The mechanism of the high enhancement is also analyzed and discussed for different plasmonic structures.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":" 54","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113948541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045788
Soundararajan Ezekiel, K. Harrity, M. Alford, Erik Blasch, D. Ferris, A. Bubalo
In the past decade, the number and popularity of digital cameras has increased many fold, increasing the demand for a blur metric and quality assessment techniques to evaluate digital images. There is still no widely accepted industry standard by which an image's blur content may be assessed so it is imperative that better, more reliable, no-reference metrics be created to fill this gap. In this paper, a new wavelet based scheme is proposed as a blur metric. This method does not rely on subjective testing other than for verification. After applying the discrete wavelet transform to an image, we use adaptive thresholding to identify edge regions in the horizontal, vertical, and diagonal sub-images. For each sub-image, we utilize the fact that detected edges can be separated into connected components. We do this because, perceptually, blur is most apparent on edge regions. From these regions it is possible to compute properties of the edge such as length and width. The length and width can then be used to measure the area of a blurred region which in turn yields the number of blurred pixels for each connected region. Ideally, an edge point is represented by only a single pixel so if a found edge has a width greater than one it likely contains blur. In order to not skew our results, a one by n-length rectangle is removed from the computed blur area. The areas are summed which will represent the total blur pixel count per image. Using a series of test images, we determined the blur pixel ratio as the number of blur pixels to the total pixels in an image.
{"title":"No-reference objective blur metric based on the notion of wavelet gradient, magnitude edge width","authors":"Soundararajan Ezekiel, K. Harrity, M. Alford, Erik Blasch, D. Ferris, A. Bubalo","doi":"10.1109/NAECON.2014.7045788","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045788","url":null,"abstract":"In the past decade, the number and popularity of digital cameras has increased many fold, increasing the demand for a blur metric and quality assessment techniques to evaluate digital images. There is still no widely accepted industry standard by which an image's blur content may be assessed so it is imperative that better, more reliable, no-reference metrics be created to fill this gap. In this paper, a new wavelet based scheme is proposed as a blur metric. This method does not rely on subjective testing other than for verification. After applying the discrete wavelet transform to an image, we use adaptive thresholding to identify edge regions in the horizontal, vertical, and diagonal sub-images. For each sub-image, we utilize the fact that detected edges can be separated into connected components. We do this because, perceptually, blur is most apparent on edge regions. From these regions it is possible to compute properties of the edge such as length and width. The length and width can then be used to measure the area of a blurred region which in turn yields the number of blurred pixels for each connected region. Ideally, an edge point is represented by only a single pixel so if a found edge has a width greater than one it likely contains blur. In order to not skew our results, a one by n-length rectangle is removed from the computed blur area. The areas are summed which will represent the total blur pixel count per image. Using a series of test images, we determined the blur pixel ratio as the number of blur pixels to the total pixels in an image.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124315539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045818
J. Farmer, M. Saville
Use of co- and cross-polarization phase history data has been shown to enhance feature extraction from synthetic aperture radar (SAR) data. Recent work with the spectrum-parted linked image test uses polarization with Fourier-based peak detection to qualify pixels for attributed scattering center (ASC) extraction from SAR phase history data. Extraction of closely spaced scattering centers suffers because only the dominant scatterer can be detected resulting in incomplete information about the object. We propose an ASC extraction method based on 2D Prony method and fully polarimetric SAR phase history similar to the SPLIT algorithm. In this work, we compare the signal parameter estimation performance when using a back-projection imaging operator to that when using 2D Prony method. We also examine the performance of feature estimation using experiments of primitive shapes that could represent a complicated feature needed for target classification.
{"title":"Qualifying pixels for attributed scattering center extraction","authors":"J. Farmer, M. Saville","doi":"10.1109/NAECON.2014.7045818","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045818","url":null,"abstract":"Use of co- and cross-polarization phase history data has been shown to enhance feature extraction from synthetic aperture radar (SAR) data. Recent work with the spectrum-parted linked image test uses polarization with Fourier-based peak detection to qualify pixels for attributed scattering center (ASC) extraction from SAR phase history data. Extraction of closely spaced scattering centers suffers because only the dominant scatterer can be detected resulting in incomplete information about the object. We propose an ASC extraction method based on 2D Prony method and fully polarimetric SAR phase history similar to the SPLIT algorithm. In this work, we compare the signal parameter estimation performance when using a back-projection imaging operator to that when using 2D Prony method. We also examine the performance of feature estimation using experiments of primitive shapes that could represent a complicated feature needed for target classification.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124043911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045823
C. Caglayan, G. Trichopoulos, K. Sertel
We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.
{"title":"THz on-wafer calibration using offset-shorts and known through as standards","authors":"C. Caglayan, G. Trichopoulos, K. Sertel","doi":"10.1109/NAECON.2014.7045823","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045823","url":null,"abstract":"We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132203706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045839
L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando
The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.
{"title":"Gate-level commercial microelectronics verification with standard cell recognition","authors":"L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando","doi":"10.1109/NAECON.2014.7045839","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045839","url":null,"abstract":"The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127069614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045770
K. Allen, J. Duran, G. Ariyawansa, J. Vella, N. Limberopoulos, A. Urbas, V. Astratov
Photonic jets are light beams focused by dielectric microspheres down to subwavelength dimensions. In this work we show that they can be used for enhancing performance of strained-layer superlattice (SLS) infrared (IR) photodiodes in the midwave-infrared spectral band (3-5 μm). We optimized the design of these structures and experimentally demonstrated the increased sensitivity compared to conventional photodetectors.
{"title":"Photonic jets for strained-layer superlattice infrared photodetector enhancement","authors":"K. Allen, J. Duran, G. Ariyawansa, J. Vella, N. Limberopoulos, A. Urbas, V. Astratov","doi":"10.1109/NAECON.2014.7045770","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045770","url":null,"abstract":"Photonic jets are light beams focused by dielectric microspheres down to subwavelength dimensions. In this work we show that they can be used for enhancing performance of strained-layer superlattice (SLS) infrared (IR) photodiodes in the midwave-infrared spectral band (3-5 μm). We optimized the design of these structures and experimentally demonstrated the increased sensitivity compared to conventional photodetectors.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114560245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045794
Tyler Highlander, Dale Bassett, Derek Boone
For the past two decades, as the role of computer technology has expanded, computer security (secure processors, information encryption, network protection with biometrics) has also become increasingly important [1-21]. Many computer security schemes have been developed over this time period; however, none of these are foolproof yet. A username and pass-word combination is one of the most popular approaches to securing a computer system, but this system is vulnerable because passwords can be stolen or cracked. However, research suggests that it is possible to identify a user based strictly on their typing style, using pattern recognition, neural networks, and other techniques. This paper focuses on using the keyboard dynamics of the user's password to add an extra layer of security to the natural log-in process.
{"title":"Utilization of keyboard dynamics for unique identification of human users","authors":"Tyler Highlander, Dale Bassett, Derek Boone","doi":"10.1109/NAECON.2014.7045794","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045794","url":null,"abstract":"For the past two decades, as the role of computer technology has expanded, computer security (secure processors, information encryption, network protection with biometrics) has also become increasingly important [1-21]. Many computer security schemes have been developed over this time period; however, none of these are foolproof yet. A username and pass-word combination is one of the most popular approaches to securing a computer system, but this system is vulnerable because passwords can be stolen or cracked. However, research suggests that it is possible to identify a user based strictly on their typing style, using pattern recognition, neural networks, and other techniques. This paper focuses on using the keyboard dynamics of the user's password to add an extra layer of security to the natural log-in process.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117163028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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