Characterization of a no-flow underfill encapsulant during the solder reflow process

C. Wong, D. Baldwin, M. Vincent, B. Fennell, L. Wang, S. Shi
{"title":"Characterization of a no-flow underfill encapsulant during the solder reflow process","authors":"C. Wong, D. Baldwin, M. Vincent, B. Fennell, L. Wang, S. Shi","doi":"10.1109/ECTC.1998.678898","DOIUrl":null,"url":null,"abstract":"A challenge in flip-chip technology development is to improve the thermo-mechanical reliability of the flip-chip assembly. To increase reliability, an underfill encapsulant is applied to the gap between IC chip and substrate to provide thermal-mechanical protection as well as environmental protection to the assembly. Two processes for applying the underfill encapsulant to the gap between IC chip and substrate can be described as the fast-flow method and the no-flow (reflowable underfill) method. The fast-flow method is currently the most widely used method. The no-flow method is a new innovative method that provides cost savings. In order to develop novel underfill encapsulants for the no-flow process, a better understanding of the underfill properties during the solder reflow is needed. This paper studies two aspects of the No-Flow underfill: fluxing activity and viscosity during reflow. These two aspects are important for proper interconnect formation. Solder wetting studies were conducted by applying the no-flow underfill on top of solder beads on substrates of different metallizations. The samples were then placed in a 7-zone reflow oven on different eutectic type heating cycles. Cross sections of the samples were taken and the angle the solder makes with the substrate was determined. The viscosity of the underfill during reflow is important to allow proper solder interconnects. To acquire the viscosity of the underfill just before, during, and shortly after the solder reflow temperature, a no-flow underfill encapsulant developed at the Georgia Institute of Technology was studied. Samples of this underfill were placed in a 5-zone reflow oven on a standard eutectic cycle and taken out at different points. The samples were then analyzed by differential scanning calorimetry (DSC) to find the % conversion (amount of cure) of the underfill material. These % conversions were then used to find the complex viscosity at different points in the reflow process. In this paper, we present the experimental procedures and results of the No-Flow underfill's fluxing abilities and viscosity during reflow heating conditions.","PeriodicalId":422475,"journal":{"name":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","volume":"132 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1998.678898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 46

Abstract

A challenge in flip-chip technology development is to improve the thermo-mechanical reliability of the flip-chip assembly. To increase reliability, an underfill encapsulant is applied to the gap between IC chip and substrate to provide thermal-mechanical protection as well as environmental protection to the assembly. Two processes for applying the underfill encapsulant to the gap between IC chip and substrate can be described as the fast-flow method and the no-flow (reflowable underfill) method. The fast-flow method is currently the most widely used method. The no-flow method is a new innovative method that provides cost savings. In order to develop novel underfill encapsulants for the no-flow process, a better understanding of the underfill properties during the solder reflow is needed. This paper studies two aspects of the No-Flow underfill: fluxing activity and viscosity during reflow. These two aspects are important for proper interconnect formation. Solder wetting studies were conducted by applying the no-flow underfill on top of solder beads on substrates of different metallizations. The samples were then placed in a 7-zone reflow oven on different eutectic type heating cycles. Cross sections of the samples were taken and the angle the solder makes with the substrate was determined. The viscosity of the underfill during reflow is important to allow proper solder interconnects. To acquire the viscosity of the underfill just before, during, and shortly after the solder reflow temperature, a no-flow underfill encapsulant developed at the Georgia Institute of Technology was studied. Samples of this underfill were placed in a 5-zone reflow oven on a standard eutectic cycle and taken out at different points. The samples were then analyzed by differential scanning calorimetry (DSC) to find the % conversion (amount of cure) of the underfill material. These % conversions were then used to find the complex viscosity at different points in the reflow process. In this paper, we present the experimental procedures and results of the No-Flow underfill's fluxing abilities and viscosity during reflow heating conditions.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
焊料回流过程中无流动底填料的特性
倒装芯片技术发展的一个挑战是提高倒装芯片组件的热机械可靠性。为了提高可靠性,在IC芯片和基板之间的间隙处应用了下填充密封剂,为组件提供热机械保护和环境保护。在IC芯片与衬底之间的间隙上施加下填充剂的两种方法可描述为快流方法和无流(可回流下填充)方法。快流法是目前应用最广泛的方法。无流法是一种节约成本的创新方法。为了开发适用于无流工艺的新型下填充剂,需要更好地了解焊料回流过程中的下填充特性。本文从两个方面研究了无流底填料的助流性和回流粘度。这两个方面对于正确形成互连非常重要。通过在不同金属化基片上的焊锡珠顶部施加无流底填料,进行了焊锡润湿研究。然后将样品置于7区回流炉中,进行不同的共晶型加热循环。取样品的横截面,并确定焊料与衬底的夹角。回流过程中底填料的粘度对于允许适当的焊料互连是重要的。为了获得焊料回流温度前、回流温度期间和回流温度后不久的底填料粘度,研究了乔治亚理工学院开发的一种无流底填料封装剂。在标准共晶循环中,将该底填料的样品置于5区回流炉中,并在不同的点取出。然后用差示扫描量热法(DSC)对样品进行分析,以确定下填料的转化率(固化量)。然后使用这些%转换来计算回流过程中不同点的复粘度。本文介绍了在回流加热条件下无流充填体的熔炼能力和粘度的实验过程和结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Dielectric constant and loss tangent measurement using a stripline fixture Use of compliant adhesives in the large area processing of MCM-D substrates Validity of mutual inductor model for electromagnetic coupling between vias in integrated-circuit packages and printed circuit boards Evaluation of solder joint reliability between PWB and CSP by using high TCE ceramic material Hermetic-equivalent packaging of GPS MCM-L modules for high reliability avionics applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1