Calculation of the reflection matrix in the plane waveguide by scanning screen method

I. L. Aleksandrova, N. Pleshchinskii
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引用次数: 1

Abstract

The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.
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用扫描屏法计算平面波导中的反射矩阵
研究了利用有限数量的反射场特征计算金属面波导中部分描述非均匀反射矩阵系数的可能性。为了获得额外的信息,建议在研究的非均匀性前面放置一个薄的导电屏。
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