A Fast Analytical Approach to Multi-cycle Soft Error Rate Estimation of Sequential Circuits

2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools Pub Date : 2010-09-01 DOI:10.1109/DSD.2010.74

M. Fazeli, S. Miremadi, H. Asadi, M. Tahoori

引用次数: 14

Abstract

In this paper, we propose a very fast analytical approach to measure the overall circuit Soft Error Rate (SER) and to identify the most vulnerable gates and flip-flops. In the proposed approach, we first compute the error propagation probability from an error site to primary outputs as well as system bistables. Then, we perform a multi-cycle error propagation analysis in the sequential circuit. The results show that the proposed approach is four to five orders of magnitude faster than the Monte Carlo (MC) simulation-based fault injection approach with 92% accuracy. This makes the proposed approach applicable to industrial-scale circuits.

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顺序电路多周期软误码率估计的快速分析方法

在本文中，我们提出了一种非常快速的分析方法来测量整个电路的软错误率(SER)，并识别最脆弱的门和触发器。在该方法中，我们首先计算从错误点到主输出和系统双表的错误传播概率。然后，我们在顺序电路中进行了多周期误差传播分析。结果表明，该方法比基于蒙特卡罗(MC)仿真的故障注入方法快4 ~ 5个数量级，准确率达到92%。这使得所提出的方法适用于工业规模的电路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

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