The next generation of quick turn method for interfacial strength testing: High Speed Ball Shear

Chee Kan Lee, R. Derek, W. K. Loh, Hui Ping Ng, K. W. Lau
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Abstract

In High Volume Manufacturing (HVM) environment, maintaining assembly process stability is the outmost priority to meet quality and reliability requirement. In recent years of transitioning to Lead Free (LF) solder alloy, tighter ball pitch and increasing hostile use condition, thus the expectation of better and tighter control in Solder Joint Reliability (SJR) is increasing. The SJR concern is not a new phenomenon, numerous research works are published to share the learning and options to resolve SJR issues including introduction of new solder alloy, Stress Compensation Layer (SCL), alternate surface finish and etc. The implementations of LF solder alloy have been found to be more at risk to brittle failure in the intermetallic layers. In view of the Flip Chip (FC) design requirement expands and evolves, it is important that the test metrology should likewise continue to evolve. The High Speed Ball Shear (HSBS) and conventional Cold Ball Pull (CBP) results are compared and discussed in term of the ability to predict susceptibility to interfacial failures due to assembly process changes for Flip Chip Ball Grid Array (FCBGA) packages. Examples of assembly process studies are Ball Attach (BA) reflow profile, effect of multiple reflows on the growth of intermetallic that affects the strength of solder joint performance, substrate plating process skew and etc. In additional, detailed microscopic analysis on post HSBS was executed to study the distribution and thickness of Intermetallic compound (IMC) layer on solder pad for FCBGA packages. The result showed that a higher sensitivity was demonstrated by HSBS as compare to CBP in assembly process shifts detection. This paper also covers the course of the development of fracture energy metric and implementations of HSBS metrology into HVM environment as an in line BA process monitoring system. Lastly, a comparison of the facture energy between ENIG and improve surface plating is provided to show the margin gained by improve surface plating technologies.
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下一代界面强度测试的快速转弯方法:高速球剪
在大批量制造(HVM)环境下,保持装配过程的稳定性是满足质量和可靠性要求的重中之重。近年来,随着向无铅(LF)钎料合金的过渡,球距越来越紧,使用条件越来越恶劣,人们对焊点可靠性(SJR)的控制越来越严格。对SJR的关注并不是一个新现象,许多研究成果已经发表,以分享解决SJR问题的经验和选择,包括引入新的焊料合金,应力补偿层(SCL),替代表面处理等。在金属间层中,LF焊料合金的实现更容易发生脆性失效。鉴于倒装芯片(FC)设计需求的扩展和发展,测试计量也应该继续发展,这一点很重要。对高速球剪切(HSBS)和常规冷球拉(CBP)的结果进行了比较和讨论,以预测倒装芯片球栅阵列(FCBGA)封装的组装工艺变化对界面失效的敏感性。装配工艺研究的例子有:球附加(BA)回流曲线、多次回流对影响焊点性能强度的金属间生长的影响、衬底电镀工艺倾斜等。此外,对FCBGA封装焊盘上金属间化合物(IMC)层的分布和厚度进行了详细的HSBS微观分析。结果表明,HSBS在装配过程位移检测中比CBP具有更高的灵敏度。本文还介绍了断裂能测量的发展过程,以及HSBS测量作为在线BA过程监控系统在HVM环境中的实现。最后,比较了ENIG和改进表面镀工艺的加工能量,显示了改进表面镀工艺所获得的余量。
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