{"title":"Measurement based behavioral modeling of impedance dependent transistor non-linearity","authors":"D. Kinzel, M. Fennelly, D. Wandrei","doi":"10.1109/WCC.1997.622259","DOIUrl":null,"url":null,"abstract":"A novel modeling approach is presented that utilizes load pull measurements at a number of known terminations and fits a data based model of the measured parameter as a function of the fundamental and harmonic termination. The techniques utilizes a solid-state, single load pull tuner without a multiplexer or harmonic loops. It creates a general equation of device performance with predictive abilities. This paper presents the measurement system, the modeling approach, and the measured and predicted results.","PeriodicalId":439434,"journal":{"name":"Proceedings of 1997 Wireless Communications Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1997 Wireless Communications Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCC.1997.622259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A novel modeling approach is presented that utilizes load pull measurements at a number of known terminations and fits a data based model of the measured parameter as a function of the fundamental and harmonic termination. The techniques utilizes a solid-state, single load pull tuner without a multiplexer or harmonic loops. It creates a general equation of device performance with predictive abilities. This paper presents the measurement system, the modeling approach, and the measured and predicted results.
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