{"title":"Managing factory risk to improve customer satisfaction","authors":"G. Depinto","doi":"10.1109/ASMC.1996.558005","DOIUrl":null,"url":null,"abstract":"Due to one single event that scrapped over 900 wafers, an approach was developed to prevent this type of catastrophic scrap from reoccurring. This factory-wide approach considered the affects of (1) People, Process and Methods; (2) Facilities; (3) Gases, Chemicals and other Source components. It also evaluated each individual process in extreme detail. This approach focused on measurable outputs to maintain process control. By implementing this approach of assessing factory risk, in-line scrap decreased by 27% over a one year period of time. In the 19 months since this approach was initiated, there has not been one in-line event that scrapped more than 375 wafers. Scrap reduction was accomplished by many different methods including increasing the sample frequency between measurable outputs, measuring product wafers where appropriate, modifying procedures including training, upgrading the factory infrastructure, adding tool sensorization, and applying SPC correctly.","PeriodicalId":325204,"journal":{"name":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","volume":"163 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1996.558005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Due to one single event that scrapped over 900 wafers, an approach was developed to prevent this type of catastrophic scrap from reoccurring. This factory-wide approach considered the affects of (1) People, Process and Methods; (2) Facilities; (3) Gases, Chemicals and other Source components. It also evaluated each individual process in extreme detail. This approach focused on measurable outputs to maintain process control. By implementing this approach of assessing factory risk, in-line scrap decreased by 27% over a one year period of time. In the 19 months since this approach was initiated, there has not been one in-line event that scrapped more than 375 wafers. Scrap reduction was accomplished by many different methods including increasing the sample frequency between measurable outputs, measuring product wafers where appropriate, modifying procedures including training, upgrading the factory infrastructure, adding tool sensorization, and applying SPC correctly.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
管理工厂风险,提高客户满意度
由于一个单一的事件报废超过900片晶圆,开发了一种方法来防止这种灾难性的报废再次发生。这种全厂范围的方法考虑了以下因素的影响:(1)人员、过程和方法;(2)设施;(3)气体、化学品和其他源组分。它还极其详细地评估了每个单独的过程。这种方法侧重于可测量的输出,以维持过程控制。通过实施这种评估工厂风险的方法,在一年的时间内,在线废品率下降了27%。自该方法启动以来的19个月里,没有发生过一次超过375片晶圆的在线事件。通过许多不同的方法来减少废料,包括增加可测量输出之间的采样频率,在适当的地方测量产品晶圆,修改程序,包括培训,升级工厂基础设施,增加工具传感器,以及正确应用SPC。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
相关文献
Sustainability growth of GST in Indian Economy- Past, Present and Future prospects
IF 0 International Journal of Research in Finance and ManagementPub Date : 2020-07-01 DOI: 10.33545/26175754.2020.v3.i2a.75
Gurave Singh, Gautam Kohli, Dr. RK Singh
GST: Fostering Sustainability in the Realm of Indian Handicrafts
IF 0 Journal of Computers, Mechanical and ManagementPub Date : 2023-09-04 DOI: 10.57159/gadl.jcmm.2.4.23094
Rishika Awasthi, Moiz Akhtar, F. S. Khan
Managing State Debt and Ensuring Solvency: The Indian Experience
IF 0 World Bank Policy Research Working Paper SeriesPub Date : 2012-04-01 DOI: 10.1596/1813-9450-6039
C. Rangarajan, A. Prasad
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Production use of an integrated automatic defect classification (ADC) system operating in a laser confocal/white light imaging defect review station Strategic alliances for equipment reliability improvement in a dynamic startup environment 16 M DRAM manufacturing cooperation IBM/SIEMENS in Corbeil Essonnes in France Semiconductor factory automation: designing for phased automation Yield risk cards at D2
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1