{"title":"A mixed digital-analog simulation and test environment","authors":"R. Lanoo","doi":"10.1109/EASIC.1990.208029","DOIUrl":null,"url":null,"abstract":"A mixed digital-analog simulation and test environment, MIXTEST, has been developed, bridging the gap between a design and test department by automatic translation of the simulation results from the mixed digital-analog simulator, MIXSIM, into a mixed test program. This system truly allows design for testability on mixed digital-analog circuits, by using a test machine database containing all restrictions of the supported test equipment, during the design phase.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.208029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
A mixed digital-analog simulation and test environment, MIXTEST, has been developed, bridging the gap between a design and test department by automatic translation of the simulation results from the mixed digital-analog simulator, MIXSIM, into a mixed test program. This system truly allows design for testability on mixed digital-analog circuits, by using a test machine database containing all restrictions of the supported test equipment, during the design phase.<>
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