Naznin Akter, M. Karabiyik, Anthony Wright, M. Shur, N. Pala
{"title":"AI Powered THz Testing Technology for Ensuring Hardware Cybersecurity","authors":"Naznin Akter, M. Karabiyik, Anthony Wright, M. Shur, N. Pala","doi":"10.1109/RAPID49481.2020.9195662","DOIUrl":null,"url":null,"abstract":"We report on a novel non-destructive testing method for integrated circuits (ICs) by measuring their response to scanning terahertz and sub-terahertz radiation at the pins. Analyzing the response using artificial intelligence (AI), counterfeit, altered, or damaged ICs can be identified as in-package and in-situ.","PeriodicalId":220244,"journal":{"name":"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAPID49481.2020.9195662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
We report on a novel non-destructive testing method for integrated circuits (ICs) by measuring their response to scanning terahertz and sub-terahertz radiation at the pins. Analyzing the response using artificial intelligence (AI), counterfeit, altered, or damaged ICs can be identified as in-package and in-situ.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
