{"title":"Development of a high speed data acquisition system based on LabVIEW(R) and VXI(R)","authors":"R.L. Deichert, D. Burris, J. Luckemeyer","doi":"10.1109/AUTEST.1997.633633","DOIUrl":null,"url":null,"abstract":"The collection of high speed, multi-channel test data in a VXI environment can be challenging, especially when the number of input channels is large and data processing is required for analysis of the test data. This paper describes a data acquisition system which was designed to acquire performance data on the Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System, as the Sub-System is functionally tested in a simulated flight test environment. The testing requires the simultaneous measurement of 53 channels of digital and analog data with a cumulative data capture rate of 100 kHz. The data is used to evaluate the reliability of the test specimen, using a post-processing algorithm. To further complicate the acquisition and post-test processing, the signals under measurement are interrelated in that some signals act as triggering events for other signals. The solution presented in this paper is a VXI-based data acquisition instrument operating with a PC running a LabVIEW(R) application while using an MXI interface for data transfer between the VXI and PC buses. The software element of this system uses a uniquely developed data analysis tool. The analysis tool, named Data Score/sup TM/, is programmed in a scripting language to allow test engineers the ability to define signal interrelations and data processing algorithms. The graphical user interface provides a flexible ability to view either post-test or archived data.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The collection of high speed, multi-channel test data in a VXI environment can be challenging, especially when the number of input channels is large and data processing is required for analysis of the test data. This paper describes a data acquisition system which was designed to acquire performance data on the Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System, as the Sub-System is functionally tested in a simulated flight test environment. The testing requires the simultaneous measurement of 53 channels of digital and analog data with a cumulative data capture rate of 100 kHz. The data is used to evaluate the reliability of the test specimen, using a post-processing algorithm. To further complicate the acquisition and post-test processing, the signals under measurement are interrelated in that some signals act as triggering events for other signals. The solution presented in this paper is a VXI-based data acquisition instrument operating with a PC running a LabVIEW(R) application while using an MXI interface for data transfer between the VXI and PC buses. The software element of this system uses a uniquely developed data analysis tool. The analysis tool, named Data Score/sup TM/, is programmed in a scripting language to allow test engineers the ability to define signal interrelations and data processing algorithms. The graphical user interface provides a flexible ability to view either post-test or archived data.