{"title":"Research of BMP and PCB Image-position in the Digital Circuit Fault Diagnosis System","authors":"Lijun Xue, Wei Su, Y. Liu","doi":"10.1109/PACCS.2009.102","DOIUrl":null,"url":null,"abstract":"This paper presents the different methods and processes of the implement of image-position technique, by which the user can locate the probe quickly and accurately during the process of circuit-fault-diagnosis. The article introduces the fault diagnosis program that can retrieves information from fault dictionary, presents the image-position technique of BMP and PCB and proposes the usage of the significant function and controls are given which can used to locate the probe accurately. During the test, the real circuit graph guides the user and points out the fault location, thus raising the efficiency of fault removal.","PeriodicalId":320447,"journal":{"name":"Pacific-Asia Conference on Circuits, Communications and Systems","volume":"428 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pacific-Asia Conference on Circuits, Communications and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PACCS.2009.102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the different methods and processes of the implement of image-position technique, by which the user can locate the probe quickly and accurately during the process of circuit-fault-diagnosis. The article introduces the fault diagnosis program that can retrieves information from fault dictionary, presents the image-position technique of BMP and PCB and proposes the usage of the significant function and controls are given which can used to locate the probe accurately. During the test, the real circuit graph guides the user and points out the fault location, thus raising the efficiency of fault removal.