D. Takashima, H. Nakano, T. Ozaki, Y. Oowaki, S. Shiratake, S. Watanabe, K. Ohuchi
{"title":"Folded-read And Open/folded-restore Bit-line Scheme For Giga Scale 6f2 Dram Cell","authors":"D. Takashima, H. Nakano, T. Ozaki, Y. Oowaki, S. Shiratake, S. Watanabe, K. Ohuchi","doi":"10.1109/VLSIC.1994.586246","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":350730,"journal":{"name":"Proceedings of 1994 IEEE Symposium on VLSI Circuits","volume":"582 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1994.586246","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}