Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement

Yuan Gong, Bincheng Li
{"title":"Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement","authors":"Yuan Gong, Bincheng Li","doi":"10.1117/12.758948","DOIUrl":null,"url":null,"abstract":"Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.758948","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
高反射率测量中基于指数衰减的腔衰荡技术中仪器响应时间的影响
基于指数衰减的腔衰荡(CRD)技术,如脉冲CRD和使用快速开关关闭激光束的连续波CRD,被广泛用于高反射率测量。本文从理论上和实验上研究了实验装置的响应时间对高反射率测量的影响。分别给出了考虑仪器响应时间的脉冲- crd和cw-CRD技术的理论表达式。通过建立一个简单的cw-CRD装置,采用不同响应时间的探测器,实验研究了仪器响应时间对高反射率测量的影响。通过将实验CRD信号拟合到相应的理论模型中,采用多参数估计技术同时确定实验装置的腔体衰减时间和总体响应时间,消除了仪器响应时间过长对反射率测定的影响。用不同上升时间的探测器测得的腔镜反射率非常一致。另一方面,对于上升时间相对较慢的探测器获得的CRD信号,简单地用单一的指数衰减拟合程序处理,高反射率测量的误差随着仪器上升/下降时间的增加而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Impact of particle shape on the laser-contaminant interaction induced damage on the protective capping layer of 1ω high reflector mirror coatings Direct comparison of statistical damage frequency method and raster scan procedure Refined metrology of spatio-temporal dynamics of nanosecond laser pulses Characterization of damage precursor density from laser damage probability measurements with non-Gaussian beams Direct absorption measurements in thin rods and optical fibers
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1