Akitaka Murata, Shuji Agatsuma, D. Ikoma, K. Ichikawa, T. Tsuda, M. Nagata, K. Yoshikawa, Y. Araga, Yuji Harada
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引用次数: 4
Abstract
In this paper, the susceptibility of a CMOS bandgap voltage reference (BGR) to external noise was investigated using an on-chip waveform monitor circuit in conjunction with circuit simulations. A Direct RF Power Injection method was employed for the immunity test of the BGR. Also, we evaluated the performance of the on-chip waveform monitor and analyze the BGR immunity using the on-chip monitor. As the results, we have clarified the mechanism of the BGR malfunction. The output voltage drop of the BGR was caused by the offset of operational amplifier in BGR.
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