{"title":"Automatic functional test program generation for microprocessors","authors":"Chen-Shang Lin, Hong-Fa Ho","doi":"10.1109/DAC.1988.14825","DOIUrl":null,"url":null,"abstract":"An algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weight-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.<<ETX>>","PeriodicalId":230716,"journal":{"name":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1988.14825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
An algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weight-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.<>
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