{"title":"A Real-Time Test and Simulation Environment Based on Standard FPGA Hardware","authors":"R. Duelks, F. Salewski, S. Kowalewski","doi":"10.1109/TAICPART.2009.24","DOIUrl":null,"url":null,"abstract":"Hardware-in-the-Loop (HiL) testing can be veryexpensive because of the high acquisition costs of the requiredhard- and software. In this paper an alternative low-costrealisation for building up a HiL Testing system is introduced.This solution is based on a standard FPGA together with anormal desktop personal computer (PC). It will be shown thatalmost all of the required features of a HiL Testing system canbe fulfilled. Furthermore, an evaluation between existing HiLsolutions and the presented low-cost solution is given whichshows that the FPGA-PC solution fulfills all requirements forcomponent tests. In conclusion, the FPGA-PC HiL solution iswell suited for component tests for electronic control units.","PeriodicalId":339626,"journal":{"name":"2009 Testing: Academic and Industrial Conference - Practice and Research Techniques","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Testing: Academic and Industrial Conference - Practice and Research Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TAICPART.2009.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Hardware-in-the-Loop (HiL) testing can be veryexpensive because of the high acquisition costs of the requiredhard- and software. In this paper an alternative low-costrealisation for building up a HiL Testing system is introduced.This solution is based on a standard FPGA together with anormal desktop personal computer (PC). It will be shown thatalmost all of the required features of a HiL Testing system canbe fulfilled. Furthermore, an evaluation between existing HiLsolutions and the presented low-cost solution is given whichshows that the FPGA-PC solution fulfills all requirements forcomponent tests. In conclusion, the FPGA-PC HiL solution iswell suited for component tests for electronic control units.