Mis-registration of Sliver Type Backdrill Impact in High Speed Signal Propagation

Han Gao, S. De, Brent Beingessner, Steve Payne, J. Drewniak
{"title":"Mis-registration of Sliver Type Backdrill Impact in High Speed Signal Propagation","authors":"Han Gao, S. De, Brent Beingessner, Steve Payne, J. Drewniak","doi":"10.1109/EMCSI.2018.8495160","DOIUrl":null,"url":null,"abstract":"Nowadays, plated-through hole (PTH) via structures are extensively used in printed circuit boards (PCBs). As the data rate increases to Gigahertz range, the via stub resonance effect shows up, which will cause signal distortion and lead to signal integrity issue. In this paper, the impact caused by backdrill mis-registration issue is investigated.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCSI.2018.8495160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Nowadays, plated-through hole (PTH) via structures are extensively used in printed circuit boards (PCBs). As the data rate increases to Gigahertz range, the via stub resonance effect shows up, which will cause signal distortion and lead to signal integrity issue. In this paper, the impact caused by backdrill mis-registration issue is investigated.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
高速信号传播中条子式回钻冲击的失配
目前,板通孔(PTH)通孔结构广泛应用于印刷电路板(pcb)中。当数据速率增加到千兆赫时,会出现过孔短段共振效应,导致信号失真,导致信号完整性问题。本文研究了反钻不对准问题所造成的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Characterization of the RFI Rectification Behavior of Instrumentation Amplifiers RFI Noise Source Quantification Based on Reciprocity Workshop - WED-PM-5 EMC for Home Appliances, Including Power Converters Applications Radiated Electric and Magnetic Field Emissions Shielding and Mitigations Emission Reduction by Optimizing Current Return Paths in Electric Vehicles
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1