Pub Date : 2018-10-17DOI: 10.1109/EMCSI.2018.8495427
Chunyu Wu, Guanghua Li, D. Pommerenke, V. Khilkevich, Gary Hess
In this paper, the rectification behavior of popular in-amps (instrumentation amplifiers) is measured in both common- and single-ended RF noise injection modes. It is recommended that AD8221 be used in common mode RF noise injection environment, and AD8220 and AD8429 be used in single-ended RF noise injection environment. The mechanism of RF noise rectification inside in-amps is also discussed. It is verified that rectification mainly happens at the non-inverting input of two op-amps in the first stage of an in-amp. The DC voltage difference between inverting input and non-inverting input of the in-amp is further amplified, which will cause a large DC offset at the output. It is shown that symmetry of the first stage in an instrumentation amplifier is very important. The asymmetry of the first stage will increase the DC offset at the output dramatically.
{"title":"Characterization of the RFI Rectification Behavior of Instrumentation Amplifiers","authors":"Chunyu Wu, Guanghua Li, D. Pommerenke, V. Khilkevich, Gary Hess","doi":"10.1109/EMCSI.2018.8495427","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495427","url":null,"abstract":"In this paper, the rectification behavior of popular in-amps (instrumentation amplifiers) is measured in both common- and single-ended RF noise injection modes. It is recommended that AD8221 be used in common mode RF noise injection environment, and AD8220 and AD8429 be used in single-ended RF noise injection environment. The mechanism of RF noise rectification inside in-amps is also discussed. It is verified that rectification mainly happens at the non-inverting input of two op-amps in the first stage of an in-amp. The DC voltage difference between inverting input and non-inverting input of the in-amp is further amplified, which will cause a large DC offset at the output. It is shown that symmetry of the first stage in an instrumentation amplifier is very important. The asymmetry of the first stage will increase the DC offset at the output dramatically.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122664425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495438
Kyunghwan Song, Subin Kim, Seungtaek Jeong, Dong-Hyun Kim, Kyungjune Son, Jin Heo, K. Han, Yusup Jung, Hongseok Kim, Joungho Kim
Recently, semiconductor devices are becoming more diverse and scaled down for various applications such as electronic devices, communication systems and automotive components. Such applications can utilize sputtered shielding structures to solve electromagnetic interference (EMI) issues. To reduce the EMI issues, copper and nickel are commonly used as sputtered shielding materials. To analyze the shielding effectiveness, we applied the Schelkunoff's theory. For the verification of the Schelkunoff's theory, we simulated and measured the shielding effectiveness of copper and nickel at the frequency range between 100 kHz and 10 MHz using two identical coils.
{"title":"Measurement, Simulation and Mathematical Estimation of Magnetic Field Shielding Effectiveness of Sputtered Shielding Materials using Spiral Coils","authors":"Kyunghwan Song, Subin Kim, Seungtaek Jeong, Dong-Hyun Kim, Kyungjune Son, Jin Heo, K. Han, Yusup Jung, Hongseok Kim, Joungho Kim","doi":"10.1109/EMCSI.2018.8495438","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495438","url":null,"abstract":"Recently, semiconductor devices are becoming more diverse and scaled down for various applications such as electronic devices, communication systems and automotive components. Such applications can utilize sputtered shielding structures to solve electromagnetic interference (EMI) issues. To reduce the EMI issues, copper and nickel are commonly used as sputtered shielding materials. To analyze the shielding effectiveness, we applied the Schelkunoff's theory. For the verification of the Schelkunoff's theory, we simulated and measured the shielding effectiveness of copper and nickel at the frequency range between 100 kHz and 10 MHz using two identical coils.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124438601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495421
V. Voicu, I. Pătru, Paul Nicoleanu, Livia-Andreea Dina, Ionuţ-Daniel Smărăndescu, P. Nicolae, R. Aipu
This paper presents some aspects regarding the electromagnetic field distribution modeling within an anechoic chamber lined with different radio-frequency absorbing materials, according to the Faraday cage principle. In order to model the distribution of the electromagnetic field inside the anechoic chamber, the CST Studio Suite simulation software was used. The modeling was performed for two types of absorbers: 3650-40- ML and 3650-50-CF. After analyzing the results obtained from the simulation of the electromagnetic field distribution, it was observed that for the frequency range 1 GHz -:- 4 GHz the performance of the 3650-40-ML material is better than that of the 3650-50-CF material. Above the frequency of 2 GHz, the performance of the two materials was similar.
本文根据法拉第笼原理，对不同吸波材料衬砌的消声室内电磁场分布进行了建模。为了模拟暗室内电磁场的分布，使用了CST Studio Suite仿真软件。对3650-40- ML和3650-50-CF两种吸收剂进行了建模。通过对电磁场分布仿真结果的分析，发现在1 GHz -:- 4 GHz频率范围内，3650-40-ML材料的性能优于3650-50-CF材料。在2ghz频率以上，两种材料的性能相似。
{"title":"Modeling the Electromagnetic Field Distribution Inside an Anechoic Chamber Lined with Different Types of Radio-Frequency Absorbers","authors":"V. Voicu, I. Pătru, Paul Nicoleanu, Livia-Andreea Dina, Ionuţ-Daniel Smărăndescu, P. Nicolae, R. Aipu","doi":"10.1109/EMCSI.2018.8495421","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495421","url":null,"abstract":"This paper presents some aspects regarding the electromagnetic field distribution modeling within an anechoic chamber lined with different radio-frequency absorbing materials, according to the Faraday cage principle. In order to model the distribution of the electromagnetic field inside the anechoic chamber, the CST Studio Suite simulation software was used. The modeling was performed for two types of absorbers: 3650-40- ML and 3650-50-CF. After analyzing the results obtained from the simulation of the electromagnetic field distribution, it was observed that for the frequency range 1 GHz -:- 4 GHz the performance of the 3650-40-ML material is better than that of the 3650-50-CF material. Above the frequency of 2 GHz, the performance of the two materials was similar.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125228607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495307
S. Cakir, O. Sen, Mesut Ozturk
The MIL-STD-461F CS101 test is one of the essential conducted immunity tests for military and aerospace equipment, however it includes some challenges in application. The major challenge is the necessity for the measurement of injected CS101 ripples under the power frequency of the EUT. The measurement of CS101 ripples on the power frequency is almost impossible without taking some extra precautions. In addition to the hard necessity of measuring the CS101 ripple voltage induced across the EUT power input, the other challenge of measuring the ripple voltage that drops across the 10 μF test capacitor under the AC power frequency of the EUT is now required by MIL-STD-461G, which aggravates the severe CS101 test conditions of AC devices. In this paper, we propose a FFT -based time domain solution and a method to instantly check the ripple voltage that drops across the power source side, in other words across the 10 μF test capacitor, during the test under the AC EUT power frequency and to verify that it is low enough and not affecting the reliability of the test. The method proposed in this paper significantly overcomes the CS101 test challenges and makes CS101 test results more accurate.
{"title":"Investigation of Ripple Voltage Across Capacitor in Military CS101Test by Using FFT -Based Time Domain Solution","authors":"S. Cakir, O. Sen, Mesut Ozturk","doi":"10.1109/EMCSI.2018.8495307","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495307","url":null,"abstract":"The MIL-STD-461F CS101 test is one of the essential conducted immunity tests for military and aerospace equipment, however it includes some challenges in application. The major challenge is the necessity for the measurement of injected CS101 ripples under the power frequency of the EUT. The measurement of CS101 ripples on the power frequency is almost impossible without taking some extra precautions. In addition to the hard necessity of measuring the CS101 ripple voltage induced across the EUT power input, the other challenge of measuring the ripple voltage that drops across the 10 μF test capacitor under the AC power frequency of the EUT is now required by MIL-STD-461G, which aggravates the severe CS101 test conditions of AC devices. In this paper, we propose a FFT -based time domain solution and a method to instantly check the ripple voltage that drops across the power source side, in other words across the 10 μF test capacitor, during the test under the AC EUT power frequency and to verify that it is low enough and not affecting the reliability of the test. The method proposed in this paper significantly overcomes the CS101 test challenges and makes CS101 test results more accurate.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116909383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495362
Jaehyoung Park, Yujun Shin, Dongwook Kim, Bumjin Park, Seungyoung Ahn
Nowadays., the demand in wireless power transfer (WPT) technology has increased due to the battery problems of portable devices such as heavy weight and inconvenience of battery charging devices. However., wireless charging portable devices radiate the magnetic field which has high chance to cause the malfunction of electric devices. Therefore, the interest and demand of research about suppression of radiated EMI are increased. The planar resonant reactive shield employs coil for power transfer, and closed loop and capacitor to reduce the EMI. The planar resonant reactive shield dramatically reduces the radiated magnetic field from WPT system. The shielding performance is compared using analytical method and measurement. The analytical solution and measurement show good agreement.
{"title":"Planar Resonance Reactive Shield for Reducing the EMI in Portable WPT Device Application","authors":"Jaehyoung Park, Yujun Shin, Dongwook Kim, Bumjin Park, Seungyoung Ahn","doi":"10.1109/EMCSI.2018.8495362","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495362","url":null,"abstract":"Nowadays., the demand in wireless power transfer (WPT) technology has increased due to the battery problems of portable devices such as heavy weight and inconvenience of battery charging devices. However., wireless charging portable devices radiate the magnetic field which has high chance to cause the malfunction of electric devices. Therefore, the interest and demand of research about suppression of radiated EMI are increased. The planar resonant reactive shield employs coil for power transfer, and closed loop and capacitor to reduce the EMI. The planar resonant reactive shield dramatically reduces the radiated magnetic field from WPT system. The shielding performance is compared using analytical method and measurement. The analytical solution and measurement show good agreement.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117066190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495243
Sebastian Koj, S. Fisahn, H. Garbe
In order to ensure a reliable operation of radio services like radio broadcasting or terrestrial navigation, the electromagnetic emissions of Wind Energy Conversion Systems (WECS) must be taken into account. Due to the enormous metrological effort as well as the dependence on weather conditions, which influences the power level of WECS, the idea of measuring the common-mode current Icm on the power line of WECS and estimating the magnetic field based on this quantity arises. Therefore, the attenuation properties of the most common tower types of WECS are examined in this work. Using the Icm and the attenuation values, a simplified procedure for the prediction of the magnetic field of WECS is presented. The achieved results allow a quick and simplified assessment of the emitted magnetic field of WECS.
{"title":"Simplified Procedure to Predict the EM Emissions of Wind Energy Conversion Systems","authors":"Sebastian Koj, S. Fisahn, H. Garbe","doi":"10.1109/EMCSI.2018.8495243","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495243","url":null,"abstract":"In order to ensure a reliable operation of radio services like radio broadcasting or terrestrial navigation, the electromagnetic emissions of Wind Energy Conversion Systems (WECS) must be taken into account. Due to the enormous metrological effort as well as the dependence on weather conditions, which influences the power level of WECS, the idea of measuring the common-mode current Icm on the power line of WECS and estimating the magnetic field based on this quantity arises. Therefore, the attenuation properties of the most common tower types of WECS are examined in this work. Using the Icm and the attenuation values, a simplified procedure for the prediction of the magnetic field of WECS is presented. The achieved results allow a quick and simplified assessment of the emitted magnetic field of WECS.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121141300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495254
{"title":"Consulting, an Academic's Experience","authors":"","doi":"10.1109/emcsi.2018.8495254","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495254","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126084264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495246
Felix Burghardt, Reyno Garbe
Electromagnetic examinations are usually very expensive. Every simulation needs time for computation and every measurement needs time for preparation. In addition, similar results are generally expected when examining similar objects. If the relation between the differences of investigated objects and their results could be found, a prediction on objects which are not yet examined would be possible. In this paper, a method based on artificial neural networks will be presented, with which a prediction of simulation results of similar objects is possible.
{"title":"Introduction of Artificial Neural Networks in EMC","authors":"Felix Burghardt, Reyno Garbe","doi":"10.1109/EMCSI.2018.8495246","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495246","url":null,"abstract":"Electromagnetic examinations are usually very expensive. Every simulation needs time for computation and every measurement needs time for preparation. In addition, similar results are generally expected when examining similar objects. If the relation between the differences of investigated objects and their results could be found, a prediction on objects which are not yet examined would be possible. In this paper, a method based on artificial neural networks will be presented, with which a prediction of simulation results of similar objects is possible.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125325830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495286
H. Barnes, S. Sandler
Power integrity applications suffer from the inability to precisely define the dynamic transient current. This has led to an increased interest in designing for a target impedance over a wide spectral bandwidth. Prior art has shown that a flat impedance design results in the lowest m V ripple excursion per Amp of step load. [1] This paper provides a simple method for estimating the required decoupling C for flat impedance. This method is then used to demonstrate the adverse effect of inductance in the PDN that requires an increase in the required total decoupling capacitance.
{"title":"Decoupling Capacitor Optimization for Flat $mathrm{Z}$ PCB Power Distribution Networks","authors":"H. Barnes, S. Sandler","doi":"10.1109/EMCSI.2018.8495286","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495286","url":null,"abstract":"Power integrity applications suffer from the inability to precisely define the dynamic transient current. This has led to an increased interest in designing for a target impedance over a wide spectral bandwidth. Prior art has shown that a flat impedance design results in the lowest m V ripple excursion per Amp of step load. [1] This paper provides a simple method for estimating the required decoupling C for flat impedance. This method is then used to demonstrate the adverse effect of inductance in the PDN that requires an increase in the required total decoupling capacitance.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115080007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495168
W. Radasky
This article consists only of a collection of slides from the author's conference presentation.
本文仅由作者在会议上发表的一些幻灯片组成。
{"title":"High Power Electromagnetics Test Facilities and Measurement Methods TC 2 Tutorial: MO-AM-3-4","authors":"W. Radasky","doi":"10.1109/emcsi.2018.8495168","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495168","url":null,"abstract":"This article consists only of a collection of slides from the author's conference presentation.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116080663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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