{"title":"Simulating DIC microscope images: from physical principles to a computational model","authors":"F. Kagalwala, T. Kanade","doi":"10.1109/PMCVG.1999.787761","DOIUrl":null,"url":null,"abstract":"Differential Interference Contrast (DIC) microscopy is a powerful visualization tool to study live biological cells. Its use in quantitative analysis, however, is limited by the nonlinear relation between image and object. Combining concepts from graphics and physics, we model these nonlinearities using a generalized ray tracer. We verify our model by comparing real image data of manufactured specimens to simulated images of virtual objects. We plan to use this model to iteratively reconstruct the three-dimensional properties of unknown specimens.","PeriodicalId":309370,"journal":{"name":"Proceedings Workshop on Photometric Modeling for Computer Vision and Graphics (Cat. No.PR00271)","volume":"27 14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Workshop on Photometric Modeling for Computer Vision and Graphics (Cat. No.PR00271)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PMCVG.1999.787761","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Differential Interference Contrast (DIC) microscopy is a powerful visualization tool to study live biological cells. Its use in quantitative analysis, however, is limited by the nonlinear relation between image and object. Combining concepts from graphics and physics, we model these nonlinearities using a generalized ray tracer. We verify our model by comparing real image data of manufactured specimens to simulated images of virtual objects. We plan to use this model to iteratively reconstruct the three-dimensional properties of unknown specimens.
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