System-in-Package design/testing in memory package

S. Chen
{"title":"System-in-Package design/testing in memory package","authors":"S. Chen","doi":"10.1109/MTDT.2007.4547601","DOIUrl":null,"url":null,"abstract":"Summary form only given. Miniaturization, electric performance and cost have drove the package thinner and thinner. System-in-package (SIP) and system-on-chip (SOC) are two competitive solutions. SIP is becoming the mainstream in assembly, which is able to short the design cycle time and speed up the new product introduction, especially in the mobile phone, hand held product and memory products. Stack dice, PoP (package-on-package) is mature and has been widely and growing up the market share. Embedded dice/substrate, fan-out-WLCSP, and TSV (through silicon via) are coming soon. Many new technology, especially for memory has been developed, they will be discussed during the sections.","PeriodicalId":422226,"journal":{"name":"2007 IEEE International Workshop on Memory Technology, Design and Testing","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2007.4547601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Summary form only given. Miniaturization, electric performance and cost have drove the package thinner and thinner. System-in-package (SIP) and system-on-chip (SOC) are two competitive solutions. SIP is becoming the mainstream in assembly, which is able to short the design cycle time and speed up the new product introduction, especially in the mobile phone, hand held product and memory products. Stack dice, PoP (package-on-package) is mature and has been widely and growing up the market share. Embedded dice/substrate, fan-out-WLCSP, and TSV (through silicon via) are coming soon. Many new technology, especially for memory has been developed, they will be discussed during the sections.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
系统封装设计/内存封装测试
只提供摘要形式。小型化、电性能和成本使得封装越来越薄。系统级封装(SIP)和片上系统(SOC)是两种相互竞争的解决方案。SIP正在成为组装的主流,它可以缩短设计周期时间,加快新产品的推出,特别是在手机,手持产品和内存产品中。Stack dice, PoP (package-on-package)是成熟的,并已被广泛和不断增长的市场份额。嵌入式芯片/衬底,扇形输出wlcsp和TSV(通过硅通孔)即将推出。许多新技术,特别是内存技术的发展,将在本节中讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An automatic design for flash memory testing System-in-Package design/testing in memory package An ALU cluster intellectual property for magnetic RAM media applications platform Future challenges and opportunities of the memory industry Next-generation non-volatile memory
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1