{"title":"BugTracer: A system for integrated circuit development tracking and statistics retrieval","authors":"T. Cardoso, J. Nacif, A. O. Fernandes, C. Coelho","doi":"10.1109/LATW.2009.4813810","DOIUrl":null,"url":null,"abstract":"Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.","PeriodicalId":343240,"journal":{"name":"2009 10th Latin American Test Workshop","volume":"1072 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 10th Latin American Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2009.4813810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.
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