{"title":"Field analysis and balancing tools","authors":"D. H. Shreve","doi":"10.1109/EEIC.2005.1566327","DOIUrl":null,"url":null,"abstract":"This paper first examines the needs for the basic set of tools for machine condition monitoring applications, including a look at the key elements of detection, analysis, and correction. It then examines the requirements for tools in each area, and proposes a solution on how they can be combined in one palm-sized instrument and portable toolkit for maintenance personnel","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"158 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEIC.2005.1566327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper first examines the needs for the basic set of tools for machine condition monitoring applications, including a look at the key elements of detection, analysis, and correction. It then examines the requirements for tools in each area, and proposes a solution on how they can be combined in one palm-sized instrument and portable toolkit for maintenance personnel
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