Real-Time Variation Mapping for parametric defect localization on ICs. Proof of concept, improvements, and application to new parameters

Abstract

Localization of parametric defects on Analog / Mixed Signal and RF devices remains a challenge today. A very promising dynamic technique to address this issue is the parametric Variation Mapping (xVM) under Thermal Laser Stimulation (TLS). In this paper, we stress the importance of high-speed integrated solution for an efficient xVM implementation, which leads to the concept of Real-Time Variation Mapping (RTVM). Two concrete FPGA-based RTVM solutions are described and validated on Analog and RF case studies. Detailed results are presented and new developments are introduced.