I. Hurez, Ted Y. G. Chen, F. Vlădoianu, V. Anghel, G. Brezeanu
{"title":"Message Recovered: A Robust Fault Detection and Reporting Method for Galvanically Isolated IGBT Gate Drivers","authors":"I. Hurez, Ted Y. G. Chen, F. Vlădoianu, V. Anghel, G. Brezeanu","doi":"10.1109/SMICND.2018.8539764","DOIUrl":null,"url":null,"abstract":"This paper presents a fault detection and reporting technique for galvanically isolated Insulated Gate Bipolar Transistor (IGBT) gate drivers. This technique provides robust transmission of Under Voltage Lock Out (UVLO) and Desaturation (DESAT) events. The proposed method was verified by means of simulations and implemented in a standard 0.25µm CMOS BCD technology, as part of a galvanically isolated IGBT gate driver. Experimental results highlight proper reporting of UVLO and DESAT faults.","PeriodicalId":247062,"journal":{"name":"2018 International Semiconductor Conference (CAS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2018.8539764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a fault detection and reporting technique for galvanically isolated Insulated Gate Bipolar Transistor (IGBT) gate drivers. This technique provides robust transmission of Under Voltage Lock Out (UVLO) and Desaturation (DESAT) events. The proposed method was verified by means of simulations and implemented in a standard 0.25µm CMOS BCD technology, as part of a galvanically isolated IGBT gate driver. Experimental results highlight proper reporting of UVLO and DESAT faults.
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