B. Doucin, C. Poivey, C. Carlotti, A. Salminen, K. Ojasalo, R. Ahonen, P. Poirot, L. Baudry, R. Harboe Sorensen
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引用次数: 9
Abstract
Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results.
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