Interdependence Modeling of the Possible Defects Set

Abstract

The paper suggests original approach to the analysis of the possible defects set elements interdependence in analog technical objects. Each element of possible defects set is put in accordance with its identifier. The content and formal concepts of dependent and independent defects classes are introduced. Within the limits of accepted restrictions, these classes simulate the cause-effect relations on the set of possible defects. Quantitative assessment of many different classes of dependent defects capacity is given. The proposed models of dependent defects classes and the well-known spanning trees theorem are used to construct an algorithm for diagnostic indicators selecting. This algorithm ensures the search depth to the dependent defects class accuracy level with much lower costs. Models of dependent defects classes can also be used in the explanatory subsystem of the expert diagnostic system, which makes it possible to take into account defects multiplicities.