DFT Challenges in Next Generation Multi-media IP

Mukund Mittal, Subrangshu Das, S. Vishwanath
{"title":"DFT Challenges in Next Generation Multi-media IP","authors":"Mukund Mittal, Subrangshu Das, S. Vishwanath","doi":"10.1109/ATS.2009.73","DOIUrl":null,"url":null,"abstract":"Multi-media based applications have increased immensely in the last few years. The need to have better video quality, higher recording and playback time, more video channels and faster time to market (TTM) requires DFT solutions that use core-based testing to allow concurrent IP and SOC development, scalable to support multiple technologies and eases the development of timing constraints. This paper describes the challenges and solutions used to address them.","PeriodicalId":106283,"journal":{"name":"2009 Asian Test Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2009.73","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Multi-media based applications have increased immensely in the last few years. The need to have better video quality, higher recording and playback time, more video channels and faster time to market (TTM) requires DFT solutions that use core-based testing to allow concurrent IP and SOC development, scalable to support multiple technologies and eases the development of timing constraints. This paper describes the challenges and solutions used to address them.
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下一代多媒体IP中的DFT挑战
基于多媒体的应用程序在过去几年中有了极大的增长。对更好的视频质量、更高的录制和播放时间、更多的视频通道和更快的上市时间(TTM)的需求要求DFT解决方案使用基于核心的测试来允许并发IP和SOC开发,可扩展以支持多种技术,并减轻开发时间限制。本文描述了挑战和解决这些问题的解决方案。
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