J.A. Bastos, J.A. Kussler, L.J. Cassol, M. Lubaszewski
{"title":"On-line test of a switching circuit","authors":"J.A. Bastos, J.A. Kussler, L.J. Cassol, M. Lubaszewski","doi":"10.1109/SBCCI.1999.803114","DOIUrl":null,"url":null,"abstract":"This paper presents the use of partial duplication to on-line test a switching circuit used in a communication system. The test methodology is validated by fault simulation. The final system is fault tolerant because a test cell may replace a faulty cell, whenever diagnosis can be successfully carried out. A prototype of the on-line testable switching circuit has been produced.","PeriodicalId":342390,"journal":{"name":"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBCCI.1999.803114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This paper presents the use of partial duplication to on-line test a switching circuit used in a communication system. The test methodology is validated by fault simulation. The final system is fault tolerant because a test cell may replace a faulty cell, whenever diagnosis can be successfully carried out. A prototype of the on-line testable switching circuit has been produced.
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