{"title":"Complex estimation of electronics quality","authors":"M. Kiselychnyk","doi":"10.1109/CPEE.2015.7333339","DOIUrl":null,"url":null,"abstract":"In this paper options for quantitative estimation of electronics quality by means of one-dimensional and two-dimensional probability density functions of parameters are discussed. A mathematical apparatus for estimation of reliability of the elements of their parametric synthesis applying the models \"parameter - tolerance range\" and \"load - load-bearing capacity of a structure\" has been proposed.","PeriodicalId":135123,"journal":{"name":"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2015-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEE.2015.7333339","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper options for quantitative estimation of electronics quality by means of one-dimensional and two-dimensional probability density functions of parameters are discussed. A mathematical apparatus for estimation of reliability of the elements of their parametric synthesis applying the models "parameter - tolerance range" and "load - load-bearing capacity of a structure" has been proposed.