{"title":"Emission measurements of microcontrollers","authors":"T. Steinecke","doi":"10.1109/ICSMC2.2003.1428203","DOIUrl":null,"url":null,"abstract":"The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour
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