Pub Date : 2003-06-01DOI: 10.1109/ICPADM.2003.1218366
W. Jianguo, Dong Wansheng, Chen Cixuan, Zhu Wenbin, Huang Ling
Withstand capacity test under lightning current, lightning impulse voltage, 50Hz AC voltage and DC voltage of many kinds of low voltage systems facility wiring have been conducted in laboratory. The result is very useful for insulation cooperation and lightning protection design of low voltage systems facility
{"title":"Lightning current and overvoltage withstand capacity test of low voltage systems facility wiring","authors":"W. Jianguo, Dong Wansheng, Chen Cixuan, Zhu Wenbin, Huang Ling","doi":"10.1109/ICPADM.2003.1218366","DOIUrl":"https://doi.org/10.1109/ICPADM.2003.1218366","url":null,"abstract":"Withstand capacity test under lightning current, lightning impulse voltage, 50Hz AC voltage and DC voltage of many kinds of low voltage systems facility wiring have been conducted in laboratory. The result is very useful for insulation cooperation and lightning protection design of low voltage systems facility","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126599990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428296
F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice
The paper shows a near field scanning method to characterize chips that leads to the prediction of the coupling phenomena on the electronic board and to the evaluation of the radiated emission at one meter. A theoretical model is first given for simple circuits. An estimation of the scalar and vector potentials is found with the EM scan. Using these results, we calculate the near and far emissions. Comparisons with experimental results are given. As a conclusion, we propose a simple model describing chip radiated emission and we show a real case use
{"title":"Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography","authors":"F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice","doi":"10.1109/ICSMC2.2003.1428296","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428296","url":null,"abstract":"The paper shows a near field scanning method to characterize chips that leads to the prediction of the coupling phenomena on the electronic board and to the evaluation of the radiated emission at one meter. A theoretical model is first given for simple circuits. An estimation of the scalar and vector potentials is found with the EM scan. Using these results, we calculate the near and far emissions. Comparisons with experimental results are given. As a conclusion, we propose a simple model describing chip radiated emission and we show a real case use","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127528660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428178
M. D'amore
The technical-scientific contents of the Transactions on EMC (EMC-T) are inspired to the main objectives of the EMC Society: "The IEEE EMC Society strives for the enhancement of electromagnetic compatibility through the generation of engineering standards, measurement techniques and test procedures, measuring instruments, equipment and systems characteristics, improved techniques and components, education in EMC and studies of the origins of interference." The elements on which the development of EMC-T should be founded are described in the paper. The topics focus primarily on the electromagnetic fields, the circuits and the measurements; the methodologies can be analytical, numerical, and experimental; and the applications concern numerous different industrial sectors
{"title":"IEEE Transactions on electromagnetic compatibility: An overview","authors":"M. D'amore","doi":"10.1109/ICSMC2.2003.1428178","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428178","url":null,"abstract":"The technical-scientific contents of the Transactions on EMC (EMC-T) are inspired to the main objectives of the EMC Society: \"The IEEE EMC Society strives for the enhancement of electromagnetic compatibility through the generation of engineering standards, measurement techniques and test procedures, measuring instruments, equipment and systems characteristics, improved techniques and components, education in EMC and studies of the origins of interference.\" The elements on which the development of EMC-T should be founded are described in the paper. The topics focus primarily on the electromagnetic fields, the circuits and the measurements; the methodologies can be analytical, numerical, and experimental; and the applications concern numerous different industrial sectors","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124900356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428315
H. Jardón-Aguilar, J. A. Tirado‐Méndez, F. Iturbide-Sanchez, O. Golovin
This paper is related to different high-linear low noise amplifiers (LNA) and high-efficiency power amplifiers (PA) performance at 1900 MHz and 900 MHz, respectively, concerning electromagnetic compatibility for being used in personal communication systems. A class A and E PAs and a common-emitter degenerated by inductance (CEDI) and an active feedback common-emitter (AFCE) LNAs were designed, simulated and compared in relation to their intermodulation product performance. The nonlinear and efficiency characteristics of a low-voltage supplied high-efficient class E PA for ISM band systems are reported. Concerning low-level voltage supplied LNAs, a very low nonlinear behavior was obtained, considering the 1 dB compression point, the intermodulation products and the third-order interception point in a wide frequency range. Such structures were polarized with 2.4 V and by using SiGe HBT as active elements
{"title":"Non-linear performance in power amplifiers and LNA at 900 MHz and 1900 MHz by using low-level voltage supply","authors":"H. Jardón-Aguilar, J. A. Tirado‐Méndez, F. Iturbide-Sanchez, O. Golovin","doi":"10.1109/ICSMC2.2003.1428315","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428315","url":null,"abstract":"This paper is related to different high-linear low noise amplifiers (LNA) and high-efficiency power amplifiers (PA) performance at 1900 MHz and 900 MHz, respectively, concerning electromagnetic compatibility for being used in personal communication systems. A class A and E PAs and a common-emitter degenerated by inductance (CEDI) and an active feedback common-emitter (AFCE) LNAs were designed, simulated and compared in relation to their intermodulation product performance. The nonlinear and efficiency characteristics of a low-voltage supplied high-efficient class E PA for ISM band systems are reported. Concerning low-level voltage supplied LNAs, a very low nonlinear behavior was obtained, considering the 1 dB compression point, the intermodulation products and the third-order interception point in a wide frequency range. Such structures were polarized with 2.4 V and by using SiGe HBT as active elements","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123470521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428305
S. Goudos, T. Samaras, E. Vafiadis, J. Sahalos
This work presents a numerical approach to the reduction of electromagnetic interference (EMI) from the emissions of ICs and PCBs inside rectangular metallic enclosures The ICs are modeled as small magnetic dipoles. Their interaction with the enclosures is studied with the dyadic Green's functions. The Monte Carlo procedure in conjunction with optimization techniques is used in order to achieve optimal placement configurations for the ICs, by minimizing the electric current density on the metallic walls. The applications of the above approach in PCB design are discussed
{"title":"Numerical approaches for EMI reduction of ICs and PCBs inside metallic enclosures","authors":"S. Goudos, T. Samaras, E. Vafiadis, J. Sahalos","doi":"10.1109/ICSMC2.2003.1428305","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428305","url":null,"abstract":"This work presents a numerical approach to the reduction of electromagnetic interference (EMI) from the emissions of ICs and PCBs inside rectangular metallic enclosures The ICs are modeled as small magnetic dipoles. Their interaction with the enclosures is studied with the dyadic Green's functions. The Monte Carlo procedure in conjunction with optimization techniques is used in order to achieve optimal placement configurations for the ICs, by minimizing the electric current density on the metallic walls. The applications of the above approach in PCB design are discussed","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129250126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428192
R. Azaro, S. Caorsi
The modulated scattering technique (MST) is a perturbative measurement technique that in the past has been employed to measure electromagnetic field, in order to minimize the perturbations introduced by conventional techniques. In this paper we describe the application of MST in some EMC calibration activities and in the evaluation of human exposure to high frequency electromagnetic fields. In particular in EMC area we consider the application of MST to field uniformity verification in a semi-anechoic chamber and in a TEM cell, while the same measurement technique is extended to a system able to evaluate the exposure to electromagnetic field in a vertical section of the human body
{"title":"MST measurement technique for EMC calibrations and exposure hazard evaluation","authors":"R. Azaro, S. Caorsi","doi":"10.1109/ICSMC2.2003.1428192","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428192","url":null,"abstract":"The modulated scattering technique (MST) is a perturbative measurement technique that in the past has been employed to measure electromagnetic field, in order to minimize the perturbations introduced by conventional techniques. In this paper we describe the application of MST in some EMC calibration activities and in the evaluation of human exposure to high frequency electromagnetic fields. In particular in EMC area we consider the application of MST to field uniformity verification in a semi-anechoic chamber and in a TEM cell, while the same measurement technique is extended to a system able to evaluate the exposure to electromagnetic field in a vertical section of the human body","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114020845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428220
E. Marthe, F. Rachidi, M. Ianoz
We present in this paper an analysis of the electromagnetic emission associated with power line communications (PLC) systems. Using coupling factors obtained experimentally for different typical indoor configurations, we calculate radiated fields associated with signals having a magnitude given by the EN550022/CISPR22 limits. We show that the resulting fields exceed, for a wide range of frequency, some of the current emission limits such as the German NB30, the BBC, the Norway and the UK MPT 1570 proposals. On the other hand, the fields remain within the limits of the extrapolated EN 55022 Class B and FCC Part 15
本文对电力线通信(PLC)系统的电磁辐射进行了分析。利用实验获得的不同典型室内配置的耦合因子，我们计算了具有EN550022/CISPR22限值给出的幅度的信号相关的辐射场。我们表明，在很宽的频率范围内，产生的场超过了目前的一些排放限制，如德国的NB30，英国广播公司，挪威和英国的MPT 1570提案。另一方面，这些领域仍然在外推的EN 55022 B类和FCC Part 15的限制范围内
{"title":"Evaluation of indoor PLC radiation resulting from conducted emission limits","authors":"E. Marthe, F. Rachidi, M. Ianoz","doi":"10.1109/ICSMC2.2003.1428220","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428220","url":null,"abstract":"We present in this paper an analysis of the electromagnetic emission associated with power line communications (PLC) systems. Using coupling factors obtained experimentally for different typical indoor configurations, we calculate radiated fields associated with signals having a magnitude given by the EN550022/CISPR22 limits. We show that the resulting fields exceed, for a wide range of frequency, some of the current emission limits such as the German NB30, the BBC, the Norway and the UK MPT 1570 proposals. On the other hand, the fields remain within the limits of the extrapolated EN 55022 Class B and FCC Part 15","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"26 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124309999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428207
A. Marinescu, A. Scornea, I. Dumbravă, G. Mihai, J. Glimm, K. Munter, R. Pape
During recent years, the pronounced electromagnetic pollution of the environment makes it ever more necessary to increase the number of calibrated field strength meters aiming at a better protection of the people and equipment against the electromagnetic radiations. The paper presents the calibration procedure and necessary equipment of RF electromagnetic field meters in the antenna field inside the semi-anechoic chamber (SAC) of ICMET. The whole calibration process is automatically controlled by a computer. Some experimental results necessary to certify the calibration system such as field uniformity, antenna conversion factor and measurement uncertainty are also presented
{"title":"Antenna field calibration laboratory for RF electromagnetic field meters","authors":"A. Marinescu, A. Scornea, I. Dumbravă, G. Mihai, J. Glimm, K. Munter, R. Pape","doi":"10.1109/ICSMC2.2003.1428207","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428207","url":null,"abstract":"During recent years, the pronounced electromagnetic pollution of the environment makes it ever more necessary to increase the number of calibrated field strength meters aiming at a better protection of the people and equipment against the electromagnetic radiations. The paper presents the calibration procedure and necessary equipment of RF electromagnetic field meters in the antenna field inside the semi-anechoic chamber (SAC) of ICMET. The whole calibration process is automatically controlled by a computer. Some experimental results necessary to certify the calibration system such as field uniformity, antenna conversion factor and measurement uncertainty are also presented","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127608868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428342
B. Babaoglu, A. Altintas, V. Erturk
Using the method of moments (MoM) for computation of radiation/scattering from large scale surfaces is a very popular approach since the obtained results are accurate and reliable. But the memory requirements in MoM to solve integral equations and the long computational time make the method less favorable. This problem is achieved by using iterative techniques in conjunction with a spectral acceleration method (J. T. Johnson and H. Chou, 1998). The operation count is reduced to O(N) where N refers to the number of unknowns. The process mentioned in this paper focuses on the terrain profiles in rural areas. The aim is to reach large distances at UHF/VHF frequencies
矩量法是计算大尺度表面辐射散射的一种常用方法，其计算结果准确可靠。但是在MoM中求解积分方程对内存的要求和较长的计算时间使得该方法不太适合。这个问题是通过使用迭代技术和谱加速方法来实现的(J. T. Johnson和H. Chou, 1998)。操作计数减少到O(N)，其中N指的是未知数的数量。本文所述的过程侧重于农村地区的地形剖面。其目的是在UHF/VHF频率上达到远距离
{"title":"An analysis of the wave propagation and the scattering from terrain profiles using iterative techniques","authors":"B. Babaoglu, A. Altintas, V. Erturk","doi":"10.1109/ICSMC2.2003.1428342","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428342","url":null,"abstract":"Using the method of moments (MoM) for computation of radiation/scattering from large scale surfaces is a very popular approach since the obtained results are accurate and reliable. But the memory requirements in MoM to solve integral equations and the long computational time make the method less favorable. This problem is achieved by using iterative techniques in conjunction with a spectral acceleration method (J. T. Johnson and H. Chou, 1998). The operation count is reduced to O(N) where N refers to the number of unknowns. The process mentioned in this paper focuses on the terrain profiles in rural areas. The aim is to reach large distances at UHF/VHF frequencies","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125711984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-05-16DOI: 10.1109/ICSMC2.2003.1428255
M. Saber
Application of microwave power for drying of products in cylinderic form is presented. Numerical analysis of mass and heat transfer of the processed material using microwave energy and hot air is carried out. The system is nonlinear one. Three dimensional finite difference using the polar coordinate system (curved boundaries) is the cornerstone of the solution of the system. To avoid physical and chemical or biological changes during manipulation, such technique possess implicit energy balance and control
{"title":"Microwave drying of cylindrical products","authors":"M. Saber","doi":"10.1109/ICSMC2.2003.1428255","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428255","url":null,"abstract":"Application of microwave power for drying of products in cylinderic form is presented. Numerical analysis of mass and heat transfer of the processed material using microwave energy and hot air is carried out. The system is nonlinear one. Three dimensional finite difference using the polar coordinate system (curved boundaries) is the cornerstone of the solution of the system. To avoid physical and chemical or biological changes during manipulation, such technique possess implicit energy balance and control","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131377370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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