Behavioral level dual-vth design for reduced leakage power with thermal awareness

Junbo Yu, Qiang Zhou, G. Qu, Jinian Bian
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引用次数: 6

Abstract

Dual-Vth design is an effective leakage power reduction technique at behavioral synthesis level. It allows designers to replace modules on non-critical path with the high-Vth implementation. However, the existing constructive algorithms fail to find the optimal solution due to the complexity of the problem and do not consider the on-chip temperature variation. In this paper, we propose a two-stage thermal-dependent leakage power minimization algorithm by using dual-Vth library during behavioral synthesis. In the first stage, we quantitatively evaluate the timing impact on other modules caused by replacing certain modules with high Vth. Based on this analysis and the characteristics of the dual-Vth module library, we generate a small set of candidate solutions for the module replacement. Then in the second stage, we obtain the on-chip thermal information from thermal-aware floorplanning and thermal analysis to select the final solution from the candidate set. Experimental results show an average of 17.8% saving in leakage power consumption and a slightly shorter runtime compared to the best known work. In most cases, our algorithm can actually find the optimal solutions obtained from a complete solution space exploration.
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行为级双v设计,减少泄漏功率与热意识
双v线设计是行为综合水平上有效的降低泄漏功率的技术。它允许设计人员用高vth实现替换非关键路径上的模块。然而,现有的构造算法由于问题的复杂性而无法找到最优解,并且没有考虑片上温度的变化。本文提出了一种基于双vth库的两阶段热相关泄漏功率最小化算法。在第一阶段,我们定量评估替换某些高Vth模块对其他模块的时序影响。在此分析的基础上,结合双vth模块库的特点,我们生成了一小部分模块替换的候选解决方案。然后在第二阶段,我们从热感知地板规划和热分析中获得片上热信息,从候选集合中选择最终解决方案。实验结果表明,与最知名的工作相比,平均节省17.8%的泄漏功耗,运行时间略短。在大多数情况下,我们的算法实际上可以找到由完全解空间探索得到的最优解。
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