{"title":"New Semiconductor Structure Capacity Measurement Method using the Differential Amplifier","authors":"N.G. Zaycev","doi":"10.1109/SIBEDM.2006.231660","DOIUrl":null,"url":null,"abstract":"A new method of measurement of capacity of semiconductor structures is presented.. The methodic design reasoning is shown. The developed method has some advantages over the balance schemes and schemes of capacity divisor. It has linear capacity-voltage relationship on the output of measuring circuit","PeriodicalId":151587,"journal":{"name":"International Workshops and Tutorials on Electron Devices and Materials","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Workshops and Tutorials on Electron Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBEDM.2006.231660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new method of measurement of capacity of semiconductor structures is presented.. The methodic design reasoning is shown. The developed method has some advantages over the balance schemes and schemes of capacity divisor. It has linear capacity-voltage relationship on the output of measuring circuit
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