Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning

Abstract

This report studies the visualization of dynamic noise current distribution in switching operation of Si and SiC power devices. The measurement system is developed to identify time-dependent near magnetic field distribution for periodic steady state circuit operation. The experimental results shown in this report demonstrate the usefulness of the developed system to identify the EMI noise generation and to visualize the time variation of noise current distribution in the power conversion circuit.