Interpretation of surface potential measurements performed with the vibrating capacitive probe of an electrostatic voltmeter

A. Fatihou, L. Dascalescu, N. Zouzou, L. Dumitran
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引用次数: 5

Abstract

In case that the vibrating capacitive probe of an electrostatic voltmeter is facing a metallic plate of known electric potential V, which can be easily imposed by connecting it to a DC high-voltage supply, the value displayed by the instrument is equal to V. The same surface potential measurement technique is employed to characterize the charging state of insulating materials, such as films or non-woven media. The aim of the paper is to give some elements of answer to the following question: What significance can be attributed to the value displayed by the electrostatic voltmeter when the charge is non-uniformly distributed at the surface of the bodies examined by the probe and no constant surface potential can be defined? The measurements were performed for some simple experimental models that simulate surface potential non-uniformity. Thus, a copper wire, a copper rod, and two aluminium strips, connected to a high-voltage supply (V = 875 V) were located at 5 mm above a grounded metal plate. The vibrating capacitive probe was placed at various distances h above the grounded plate and at various distances x from the axial plan of the high-voltage strip/rod/wire - grounded plate system. Different V(x) curves obtained for each of the situations under study, pointing out that the value displayed by the instrument depends on the distribution of the potential across the surface examined by the probe. A commercial computer program based on the superficial charge simulation method was employed for the numerical analysis of the electric field in a simplified model of the geometric system formed by the probe, the high-voltage strip/rod/wire, and the grounded plate. The potential that anneals the electric field at the surface of the probe (to simulate its principle of operation) was calculated by an iterative method. A good agreement was found between the results of the numerical simulations and the experimental data.
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解释用静电电压表的振动电容式探头进行的表面电位测量
静电电压表的振动电容探头面对已知电势V的金属板时,通过将金属板连接到直流高压电源上即可很容易地施加电势V,则仪表显示的值等于V。同样的表面电位测量技术也用于表征绝缘材料(如薄膜或无纺布介质)的充电状态。本文的目的是给出以下问题的一些基本答案:当电荷在探针所检测的物体表面不均匀分布且不能确定恒定的表面电位时,静电电压表所显示的值有什么意义?对一些模拟表面电位不均匀性的简单实验模型进行了测量。因此,连接到高压电源(V = 875 V)的一根铜线、一根铜棒和两条铝带位于接地金属板上方5mm处。振动电容探头放置在接地板上方不同距离处h和离高压条/棒/线接地板系统轴向平面不同距离处x。在研究的每一种情况下,得到不同的V(x)曲线,指出仪器显示的值取决于探头所检测的表面上电位的分布。采用基于表面电荷模拟方法的商用计算机程序,对由探头、高压条/棒/线和接地板组成的几何系统简化模型中的电场进行了数值分析。用迭代法计算了探针表面电场的退火电位(用以模拟探针的工作原理)。数值模拟结果与实验数据吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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