{"title":"Measurement Information Infrastructure (MII) Projects and Outlook ","authors":"M. Kuster","doi":"10.51843/wsproceedings.2020.23","DOIUrl":null,"url":null,"abstract":"Have you heard of digital calibration certificates? Digital metrology? The digital quality infrastructure? The European Metrology Cloud? These globally scattered initiatives all seek to upgrade our industry from Metrology 2.5 to Metrology 4.0 by automating our remaining manual systems via networked intercommunication. Laboratories have long since automated many of their test and measurement processes, but the global quality infrastructure remains mired in paper and pdf documents that a) require subject-matter experts to interpret, and b) omit information that would have value if automatically put to use. NCSLI’s own initiative, the Measurement Information Infrastructure (MII), envisions a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information seamlessly among our computing systems with little to no manual intervention. In this panel session, the NCSLI MII & Automation Committee will present its MII Vision, progress and outlook and describe some of the ongoing efforts. An open discussion and Q&A session will follow so that you may understand how an MII might affect your business and value stream.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NCSL International Workshop & Symposium Conference Proceedings 2020","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51843/wsproceedings.2020.23","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Have you heard of digital calibration certificates? Digital metrology? The digital quality infrastructure? The European Metrology Cloud? These globally scattered initiatives all seek to upgrade our industry from Metrology 2.5 to Metrology 4.0 by automating our remaining manual systems via networked intercommunication. Laboratories have long since automated many of their test and measurement processes, but the global quality infrastructure remains mired in paper and pdf documents that a) require subject-matter experts to interpret, and b) omit information that would have value if automatically put to use. NCSLI’s own initiative, the Measurement Information Infrastructure (MII), envisions a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information seamlessly among our computing systems with little to no manual intervention. In this panel session, the NCSLI MII & Automation Committee will present its MII Vision, progress and outlook and describe some of the ongoing efforts. An open discussion and Q&A session will follow so that you may understand how an MII might affect your business and value stream.