{"title":"Super-resolved identification of nanoscale defects in low-dimensional materials by near-field photoluminescence mapping","authors":"Huang Jiatai, T. Cui, Bai Benfeng","doi":"10.1117/12.2642169","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":202346,"journal":{"name":"Advanced Optical Imaging Technologies V","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Optical Imaging Technologies V","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2642169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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