G. Garcia-Torales, J. Castrellón-Uribe, Enrique Herrera Patiño
{"title":"Pressure monitoring over surfaces with sensitive paint by optical spectroscopy and intensity-based methods","authors":"G. Garcia-Torales, J. Castrellón-Uribe, Enrique Herrera Patiño","doi":"10.1117/12.852083","DOIUrl":null,"url":null,"abstract":"We present experimental results of monitoring pressure over samples painted with paint called Pressure Sensitive Paint (PSP), employing optical spectroscopy and imaging analysis. An electronic system to control pressure is implemented to restricted low pressure monitoring of the samples with PSP. The surface under analysis is excited with 370 nm wavelength (UV). The signal of fluorescence generated at 580 nm is correlated to variation of pressure over the interval of 4 to 200 kPa. As a complement, a set of images is acquired in the same interval of pressure. The images are processed and then lead to a set of histograms obtained from the samples images. We assess the transfer function of the system analyzing the histograms and the spectral response curves.","PeriodicalId":359625,"journal":{"name":"Symposium on Optics in Industry","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium on Optics in Industry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.852083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present experimental results of monitoring pressure over samples painted with paint called Pressure Sensitive Paint (PSP), employing optical spectroscopy and imaging analysis. An electronic system to control pressure is implemented to restricted low pressure monitoring of the samples with PSP. The surface under analysis is excited with 370 nm wavelength (UV). The signal of fluorescence generated at 580 nm is correlated to variation of pressure over the interval of 4 to 200 kPa. As a complement, a set of images is acquired in the same interval of pressure. The images are processed and then lead to a set of histograms obtained from the samples images. We assess the transfer function of the system analyzing the histograms and the spectral response curves.