V. Flores, Amalia G. Martinez, J. Rayas, K. Genovese
{"title":"Spatial location of reference points for the study in 360° of an object using Stereo Vision","authors":"V. Flores, Amalia G. Martinez, J. Rayas, K. Genovese","doi":"10.1117/12.912960","DOIUrl":null,"url":null,"abstract":"Stereo Vision is a powerful tool used to make a 360° scan of an object in order to obtain topography details or getting the spatial position of interest points, but the process could be slow due to the computing time. In this work we present the alternative of using high reflective markers, which are used as reference points to track an object movement. The advantage of these markers is that their detection is faster than a full scene correlation and it is done by comparing the position of the centroids of each marker without using pixel-pixel analysis.","PeriodicalId":359625,"journal":{"name":"Symposium on Optics in Industry","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium on Optics in Industry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.912960","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Stereo Vision is a powerful tool used to make a 360° scan of an object in order to obtain topography details or getting the spatial position of interest points, but the process could be slow due to the computing time. In this work we present the alternative of using high reflective markers, which are used as reference points to track an object movement. The advantage of these markers is that their detection is faster than a full scene correlation and it is done by comparing the position of the centroids of each marker without using pixel-pixel analysis.