A-J Plane Analysis: A Technique For Active Diode Design

P. Blakey, T. Linton
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引用次数: 2

Abstract

1. INTRODUmON The design of nonlinear transit-time microwave and millimeter-wave semiconductor diodes (such as IMPA?T’s) is often based on simple scaling ideas, sometimes assisted by large-signal time-domain computer simulation. It is often found that simple scaling of structures from one frequency to another does not lead to optimum results. In addition, anticipated performance improvements from design changes (e.g. use of different structures, materials, heatsinking, etc.) are often not achieved. Large-signal time-domain simulation can be used to assist the: design of active microwave and millimeter wave diodes. However such simularion prov~des a per unit area characterization of specific diode structures. It yields efficiency data, output power per unit area, and impedance per unit area, but does not, by itself, predict optimum areas and maximum output powers. A-J plane analysis has been developed to overcome the above problems. It is a rapid graphical procedure which provides good physical insight. A-J plane analysis may be used on a stand-alone basis, to permit rapid assessment of the likely effect of proposed design changes (e.g. different structures, different materials, or different heatsinking arrangements). The combination of A-J plane analysis with large-signal time-domain simulation provides a complete CAD capability for design and optimization (of active diodes. The central idea of A-J plane analysis is to establish the limits of allowed combinations of area (A) and DC cumnt density (4. Allowed combinations an: limited by several mechanisms, including: thermal limitations; space-charge-induced field perturbations; and various impedance limitations. Each of these limitations gives rise to a boundary in the A-J plane between allowed and disallowed combinations of area and cimnt density. The location of each boundary line is a function of material, saucture, and frequency. A-J plane diagrams are figures showing all the A-J plane constraints. The area and DC current density combination corresponding to maximum input power, and the factors limiting the input power, are easily established using A-J plane diagrams. The utility of proposed design changes is easily established by constructing a modified A-J plane diagram and seeing whether the new design permits significantly higher input powers. The organization of the paper is as follows. The mapping of individual design constraints on to the A-J plane is described in the next section. Stand-alone interpretation and use of A-J plane diagrams is discussed in section 3. Examples are provided showing how to assess the influence of changes of heatsinking arrangement, structme, and semiconductor material. Complete design procedures using large-signal timedomain computer simulation in conjunction with A-J plane analysis are discussed in section 4.
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A- j平面分析:有源二极管设计的一种技术
1. 非线性穿越时间微波和毫米波半导体二极管(如IMPA?T)的设计通常基于简单的缩放思想,有时借助于大信号时域计算机模拟。人们经常发现,简单地将结构从一个频率缩放到另一个频率并不能得到最佳结果。此外,设计变更(例如使用不同的结构、材料、散热等)所带来的预期性能改进往往无法实现。大信号时域仿真可用于辅助有源微波二极管和毫米波二极管的设计。然而,这种模拟提供了特定二极管结构的单位面积表征。它产生效率数据、单位面积输出功率和单位面积阻抗,但本身不能预测最佳面积和最大输出功率。A-J平面分析就是为了克服上述问题而发展起来的。这是一个快速的图形程序,提供了良好的物理洞察力。a - j平面分析可以单独使用,以便快速评估设计变更的可能影响(例如,不同的结构,不同的材料,或不同的散热安排)。a - j平面分析与大信号时域仿真相结合,为有源二极管的设计和优化提供了完整的CAD能力。A- j平面分析的中心思想是确定面积(A)和直流密度(4)的允许组合的极限。允许的组合:受几种机制的限制,包括:热限制;空间电荷场微扰;以及各种阻抗限制。这些限制中的每一个都会在a - j平面上产生允许和不允许的面积和密度组合之间的边界。每条边界线的位置是材料、结构和频率的函数。A-J平面图是表示所有A-J平面约束的图形。利用A-J平面图可以很容易地确定最大输入功率对应的面积和直流电流密度组合,以及限制输入功率的因素。通过构造修改后的a - j平面图并观察新设计是否允许显著提高输入功率,可以很容易地确定所提出的设计变更的效用。本文的组织结构如下。下一节将描述单个设计约束到A-J平面的映射。A-J平面图的独立解释和使用将在第3节中讨论。举例说明了如何评估散热布置、结构和半导体材料变化的影响。在第4节中讨论了使用大信号时域计算机模拟结合A-J平面分析的完整设计程序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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