Test application time and volume compression through seed overlapping

Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI:10.1145/775832.776020

Wenjing Rao, I. Bayraktaroglu, A. Orailoglu

引用次数: 57

Abstract

We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architecture of the existing SCC scheme, while it attempts to overlap consecutive test vector seeds, thus providing increased flexibility in exploiting effectively the large volume of don't-care bits in test vectors. We also introduce modified ATPG algorithms upon the previous SCC scheme and explore various implementation strategies. Experimental data exhibit significant reductions on test time and volume over all current test compression techniques.

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通过种子重叠测试应用时间和体积压缩

本文提出了扫描链隐藏技术的扩展，以进一步减少测试时间和体积要求。所提出的方法源于现有SCC方案的体系结构，同时它试图重叠连续的测试向量种子，从而在有效利用测试向量中大量不关心的比特方面提供了更大的灵活性。我们还在之前的SCC方案的基础上引入了改进的ATPG算法，并探讨了各种实现策略。实验数据显示，与所有当前的测试压缩技术相比，测试时间和体积显著减少。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)

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