Modeling of brownian-bridge-based analysis of the segmental D/A converters yield

Wenyuan Ling, Chaodong Li Guogang
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Abstract

According to the stochastic process of Brownian bridge theory, a DAC model of INL and segment ratio is presented based on the INL probability density for segmental current-steering DAC. The approximate formula for influence of chip yield in the current mismatch is obtained and the model is carried out by Monte Carlo simulation method. It is demonstrated that DAC yield is lower compared using thermometer-code to using binary-code in the low-bits. When transform bits N<12, the greater binary-code(>[N/2]), the higher yield. Binary-code bits is not suitable for large when N≥12.
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分段数模转换器成品率的布朗桥分析建模
根据布朗桥理论的随机过程,提出了一种分段电流转向DAC的基于INL概率密度的INL和分段比的DAC模型。得到了电流失配对芯片良率影响的近似公式,并用蒙特卡罗模拟方法建立了模型。结果表明,与在低位使用二进制码相比,使用温度计码的DAC产率更低。当变换位为N[N/2])时,良率更高。当N≥12时,二进制码位不适合大。
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