{"title":"Redefining the virtual instrument: merging simulation and test and measurement","authors":"P. van Halen, G. Boyle","doi":"10.1109/MWSCAS.1995.504442","DOIUrl":null,"url":null,"abstract":"The latest generation of circuit designers are much more familiar with CAD systems, with their graphical user interfaces, than with traditional test and measurement instruments. In this project we have built on this familiarity by using the well-known CAD environment to run both virtual and actual Test and Measurement devices. Using the Analog Design System/Model Development System, a simulation environment with a powerful model developing language, we developed instrument simulation models for T&M equipment. Every model is a high-level functional description of the salient features of an instrument. With these instrument models, the circuit designer can now evaluate the validity of a specific customized testing procedure through simulation. Since the customized test has all the information needed to perform the actual measurement, ADS can use this information to virtually control the actual instrument.","PeriodicalId":165081,"journal":{"name":"38th Midwest Symposium on Circuits and Systems. Proceedings","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"38th Midwest Symposium on Circuits and Systems. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.1995.504442","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The latest generation of circuit designers are much more familiar with CAD systems, with their graphical user interfaces, than with traditional test and measurement instruments. In this project we have built on this familiarity by using the well-known CAD environment to run both virtual and actual Test and Measurement devices. Using the Analog Design System/Model Development System, a simulation environment with a powerful model developing language, we developed instrument simulation models for T&M equipment. Every model is a high-level functional description of the salient features of an instrument. With these instrument models, the circuit designer can now evaluate the validity of a specific customized testing procedure through simulation. Since the customized test has all the information needed to perform the actual measurement, ADS can use this information to virtually control the actual instrument.