{"title":"A 1 V built-in intermediate voltage sensor","authors":"Jing-Jou Tang","doi":"10.1109/APASIC.1999.824088","DOIUrl":null,"url":null,"abstract":"In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits.","PeriodicalId":346808,"journal":{"name":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.1999.824088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits.
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