Electron transport in CeOx-based resistive switching devices

E. Miranda, J. Suñé, S. Kano, C. Dou, K. Kakushima, H. Iwai
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Abstract

The electron transport in electroformed W/CeOx/SiO2/NiSi2 capacitors grown onto a p+-type Si substrate is investigated within the framework of the Landauer theory for mesoscopic systems. It is shown that the devices exhibit bipolar resistive switching with conductance levels in the low resistance state (LRS) of the order of integer and half integer values of the quantum conductance unit G0 = 2e2/h. This is consistent with the so-called nonlinear conduction regime in quantum point contacts. A simple model for the LRS I-V characteristics which accounts for the available right- and left-going conduction modes allowed by the constriction's size and the voltage drop distribution along the filamentary path is presented.
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基于ceox的阻性开关器件中的电子输运
在介观体系的Landauer理论框架下,研究了在p+型Si衬底上生长的电致W/CeOx/SiO2/NiSi2电容器中的电子输运。结果表明,器件表现出双极电阻开关,电导水平在量子电导单位G0 = 2e2/h的整数和半整数量级的低阻状态(LRS)。这与量子点接触中所谓的非线性传导机制一致。给出了一个简单的LRS I-V特性模型,该模型考虑了缩窄尺寸和沿丝状路径的压降分布所允许的左向和右向传导模式。
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