{"title":"Case study: an NTSC imaging system timing gate array design","authors":"J. Vincent","doi":"10.1109/ASIC.1989.123214","DOIUrl":null,"url":null,"abstract":"A case study of the design of a timing generator ASIC (application-specific integrated circuit) for an NTSC-compatible imaging system is presented. The case history includes many of the classic problems in this type of design. Consideration is given to the problems of changing specifications during the design process, adding special functionality while minimizing testability enhancements, the pressure of timeliness, and the importance of thoroughly verifying every part of the design.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123214","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A case study of the design of a timing generator ASIC (application-specific integrated circuit) for an NTSC-compatible imaging system is presented. The case history includes many of the classic problems in this type of design. Consideration is given to the problems of changing specifications during the design process, adding special functionality while minimizing testability enhancements, the pressure of timeliness, and the importance of thoroughly verifying every part of the design.<>
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