UWB channel measurement and development of scatterer identification algorithm

Abstract

Ultra wideband is a promising technology for achieving high data rate communication. When channel measurements are conducted, the channel values can be extracted using CLEAN deconvolution algorithm. However, artifact paths can be generated during this process. These artifact paths are registered as channel element values representing a reflected signal from a scatterer. In reality, these mentioned paths does not represent a real scattering environment which affects accurate channel modeling. Therefore, removing the artifact paths is important to conserve better and more real scattering environment. In this paper, a scattering identification algorithm that can be used upon CLEAN algorithm is presented. It has been developed based on the geometric elliptical modeling approach. Results show that the developed algorithm can remove additional paths in a particular delay bin and conserve one channel values in that bin.