{"title":"ASIC technical training-the challenges and opportunities","authors":"N. Ballinger","doi":"10.1109/ASIC.1989.123251","DOIUrl":null,"url":null,"abstract":"The author explores the challenges for ASIC (application-specific integrated circuit) technical training, now and in the future, in the area of standard product vs. ASIC training (i.e. microcontrollers). She examines the opportunity for setting the ASIC customer up for success through training. Specifically, the author introduces a method for training designed to reduce the risk involved in ASIC design. She explores some future opportunities for educating industry and universities in the area of ASIC design.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123251","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The author explores the challenges for ASIC (application-specific integrated circuit) technical training, now and in the future, in the area of standard product vs. ASIC training (i.e. microcontrollers). She examines the opportunity for setting the ASIC customer up for success through training. Specifically, the author introduces a method for training designed to reduce the risk involved in ASIC design. She explores some future opportunities for educating industry and universities in the area of ASIC design.<>
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