An Integrated Method of HALT-HASS-ADT for Space Electronic Products

Abstract

Space electronic products usually have to meet the requirements of high reliability and long lifetime, and it is hard to obtain sufficient reliability data in the general accelerated testing. Highly accelerated life testing (HALT) and highly accelerated stress screening (HASS) can be used to improve the reliability of long lifetime products; however, they are mainly applied in qualitative method. This paper integrated degradation analysis as a quantitative assessment method after HALT and HASS. A method based on the integration of HALT, HASS and accelerated degradation testing (ADT) (HHA) is proposed. Firstly, the basic framework of HHA is developed based on the three accelerated testing methods. Secondly, the HHA model and degradation data model are researched. Lastly, a case study was performed on solid state drives (SSDs). Research shows that the HHA method is effective and could be applied in the space electronic products.