GaN-based violet lasers grown on sapphire with a novel facet fabrication method

Yingdong Tian, Yun Zhang, Jianchang Yan, Xiang Chen, Yanan Guo, Xuecheng Wei, Junxi Wang, Jinmin Li
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Abstract

Smooth and vertical facets for InGaN/GaN double heterostructure lasers grown on sapphire substrate are formed via a two-step method of dry etching and wet chemical etching. This two-step process consists of an inductively coupled plasma (ICP) etching with Ni metal as an etching mask to define the cavity length of the laser bars, followed by crystallographic wet etching in AZ400K developer to reduce the roughness and improve verticality of the sidewall. Optimization of ICP etching processes included the gas flow rate of Cl2/Ar and the radiofrequency (RF) power to obtain a heavily striated facet angle of 3° from vertical. Combined with the wet etching processes, the facets along 〈112̅̅0〉 direction became smooth and vertical due to the preferentially etching feature of AZ400K in exposing the (101̅0) and other (101̅n)-type planes because of their slow etch rates compared with the other planes. To confirm the feasibility of the two-step etching facets, optically pumping experiment was carried out on InGaN/GaN double heterostructure lasers. Lasing behaviors of longitudinal mode peaked at 375 nm with a narrow line width of 1.3 nm was demonstrated on the laser using this two-step etching process, and proved it an effective way for laser facets fabrication method.
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基于氮化镓的紫光激光器在蓝宝石上生长,采用了一种新颖的小面制造方法
在蓝宝石衬底上生长的InGaN/GaN双异质结构激光器采用干法蚀刻和湿法化学蚀刻两步法形成光滑和垂直的刻面。这两步工艺包括电感耦合等离子体(ICP)蚀刻,以Ni金属作为蚀刻掩膜来确定激光棒的腔长,然后在AZ400K显色剂中进行晶体学湿法蚀刻,以减少粗糙度并提高侧壁的垂直度。优化ICP刻蚀工艺包括Cl2/Ar的气体流速和射频(RF)功率,以获得从垂直方向3°的严重条纹面角。结合湿法蚀刻工艺,由于AZ400K在(101 ~ 0)和(101 ~ n)型平面的优先蚀刻特性,使得< 112 ~ 0 >方向的刻面变得光滑和垂直,因为它们的蚀刻速率比其他平面慢。为了验证两步刻蚀面的可行性,在InGaN/GaN双异质结构激光器上进行了光泵浦实验。采用两步刻蚀工艺在激光上显示了纵向模式的激光行为,其峰值为375 nm,窄线宽为1.3 nm,证明了该方法是激光切面制造方法的有效途径。
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